Reliability assessment of optoelectronic and photonic devices in severe environments: architecture and applications of the OpERaS consortium OpERaS : Op to- E lectronic R eliability a pplied to S evere environments L. BECHOU, P. SPEZZIGU Laboratoire IMS University of Bordeaux 1 CNRS UMR 5218 phone : + 33 5 4000 2767 laurent.bechou@ims-bordeaux.fr piero.spezzigu@ims-bordeaux.fr 1 1 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
Space : an example of severe environments RADIATIONS + HIGH THERMAL CYCLING : -160 ° C/+150 ° C + VACUUM (10 -9 torr) + VIBRATIONS ( ± 10g) + ELECTROSTATIC DISCHARGE 2 2 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
Optoelectronic in space applications Technologies : � Solid-State Lasers: LIDAR, metrology, interferometer, atomic clocks… � Detectors (X -> IR) and fiber sensors: T, P, mechanical stress � Optical links and interconnects: Intra-&Inter-satellite, Inter-chip Source : Courtesy of Lumics GmbH, Berlin � Photonic Signal Processing, Non-linear optics: optical data storage, µwave generation, MOEMS… Applications : � Astronomy / Planetary Exploration, Fundamental Science � Earth Observation, Remote Sensing � Telecom - Navigation � Space Transportation � ISS Source : E. Armandillo, Space Optoelectronic Day, Cork, 2006 3 3 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
Evaluation/Qualification strategy and feed-backs (1/3) • General strategy – tests according to MIL, Telcordia or electronic-related ESCC standards • Huge constraints – Cost reduction • small number of device per test groups • few characterisation steps and few number of electro-optical parameters measured – Tight time schedule • not enough time between reference selection and FM procurement • evaluation phase are more and more avoided – Small procurement volume (i.e. few tens of devices) • Insufficiently attractive for COTs manufacturers – Specific environments (i.e. radiation, vacuum, high temperature range) – Few amount of reliability data (especially true for custom devices or low volume productions) 4 4 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
Evaluation/Qualification strategy and feed-backs (2/3) • Feed-backs – Standard tests are generally not well-fitted for the devices – Due to the small number of devices the objectives of the evaluation/qualification phases are not obvious ( Could we rely on these tests to guarantee the reliability of the device during the space mission ? How could we prove it ?) – Difficulty to find companies that could take in charge evaluation/qualification tests ( The manufacturers are not always interested due to the low procurement volume) – Many anomalies during evaluation or qualification phases – Difficulties to identify physical root causes and prediction of operating lifetime is traditionally extracted from empirical laws using classical methodologies ( t 50% , MTTF…) 5 5 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
Evaluation/Qualification strategy and feed-backs (3/3) THE "VICIOUS" CIRCLE FOR COTs DEVICES RELIABILITY ! Device to qualify Standard evaluation Strong over-cost due to : - Time-schedule delay - Additional tests and devices Failure A (often unknown root cause) xN xM Best-fitted evaluation Failure B (often unknown root cause) Qualification 6 6 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
European space industry needs expression (2/2) Round table "Main issues to be solved" - 12 may 2006 Round table "Main issues to be solved" - 12 may 2006 Workshop "Laser Diodes for Space Applications" (CNES Toulouse-France) Workshop "Laser Diodes for Space Applications" (CNES Toulouse-France) 7 7 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
General objectives of OpERaS • Scientific and technical Consortium between IMS Laboratory (University Bordeaux 1), AdvEOTec (French SME) and THALES Information Security System set up in 2007 • High synergy between industrial and academic expertises • Establish a network of knowledge and experience (at European level) • Data capitalization (AdvEOTec – Eurelnet/IMS) depending on cooperative agreement level & NDA (respect to industrial or R&D benefits) • Driving force for implementation of new characterization techniques • Implementation of new approaches for reliability prediction in space environments (mixing physical failure analysis and statistical approaches) 8 8 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
OpERaS added-value proposition Failure Modes and Effects Analysis Failure Modes and Effects Analysis First design First design Technological weakness points identification Technological weakness points identification (semiconductor, assembling processes) (semiconductor, assembling processes) Reliability Evaluation Reliability Evaluation prediction "Safe" qualification area assessment prediction "Safe" qualification area assessment Qualification test Customized Qualification test Customized conditions qualification conditions qualification 9 9 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
OpERaS value chain Operator Final client Space charge Satellite or space manufacturer vehicles OpERaS Space Reliability On-board instrument Assessment, equipments manufacturer Tests, Qualifications Optoelectronic Components components fabrication 10 10 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
OpERaS architecture CLIENT Optoelectronic end-user Data capitalization in a specific data base OpERaS Project (n°i) Manufacturer (respect to NDA) Steering Committee CLIENT, AdvEOTec, IMS, TISS, (www.eurelnet.org) Manufacturer Expertise and research Expertise and research Evaluation & Evaluation & management, management, Cross-correlation qualification qualification Technological analysis and Technological analysis and in metrology and measurements tests management tests management failure mechanisms modelling failure mechanisms modelling Tests Tests Tests Tests Analysis Analysis Analysis Analysis A B C Z 1 2 3 n AdvEOTec Partner 1 Partner 2 Partner i IMS, TISS Lab A Lab B Lab N 11 11 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
GALILEO Project : Study of 850nm silicon photodiodes degradation under radiation effects : Gamma (ionizing dose), Protons (displacement dose) Incident light SiO2 P + - 1µm N - 320 µm - + R S1337 BQ/BR = J . P ph opt Hamamatsu T (detection, dosimetry) N + -1 µm 12 12 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
Project organization example (1/2) Client : CNES Client : CNES Selected component: Selected component: PIN 850nm Si photodiode (COTs) PIN 850nm Si photodiode (COTs) Application : Galileo (atomic clock) Application : Galileo (atomic clock) Initial characterizations Initial characterizations (I-V, S- λ , Linearity, NEP) (I-V, S- λ , Linearity, NEP) Pre-evaluation phase "Light" (radiation effects) Pre-evaluation phase Modelling Qualification phase Bibliography Ex. SIMS profile in P + zone Failure mechanisms (extraction of dopants concentration) Operating lifetime 13 13 L. Bechou – Round Table ISROS 2009 – 12 may 2009 L. Bechou, P. Spezzigu – QCA Days – 28 and 29 March 2011, ESA/ESTEC
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