The X-ray Correlation Spectroscopy Instrument at LCLS Aymeric Robert XCS Instrument @ LCLS Aymeric ROBERT 1 1 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
The XCS Team C. Caronna S. Lee XCS Group User Support and Science team LUSI Engineering Team V. Srinisivan T. Osier H. Navtej M. Kosovsky H. Alvarez Lead by E. Bong and MANY others … XCS Instrument @ LCLS Aymeric ROBERT 2 2 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
LCLS Parameters Parameter Hard X-ray Unit Fundamental Wavelength ≥ 1.4 Å Photon Energy ≤ 9000 eV Photons per Pulse 2-0.1 10 12 Repetition Rate Up tp 120 Hz Pulse Bandwidth 0.2 % Pulse Duration (fwhm) 80-2 fs XCS Instrument @ LCLS Aymeric ROBERT 3 3 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
XPCS capabilities at LCLS Ultra Fast Mode Sequential Mode Full Transverse Coherence, 4-24keV LCLS Beam Parameters High Time–average Brilliance, rep. Rate 120 Hz High Peak Brilliance, short pulse duration <200fs XCS Instrument @ LCLS Aymeric ROBERT 4 4 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
XCS Instrument Location Near Experimental Hall AMO SXR X-ray Transport Tunnel (200m) XPP XCS CXI Source to Sample distance : ~ 420 m MEC Far Experimental Hall XCS Instrument @ LCLS Aymeric ROBERT 5 5 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
Far Experimental Hall CXI Control Room XCS Control Lab Area Room Matter in Extreme Condition X-ray Instrument XCS Correlation Vestibule Coherent X-ray Imaging Spectroscopy Instrument Instrument XCS Instrument @ LCLS Aymeric ROBERT 6 6 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
XCS Instrument Overview Photon Shutter Requirement Device Primary Slits Tailor X-ray spatial profile X-ray Slits Diagnostics Select X-ray energy and tailor spectrum width Monochromators Monochromators Control longitudinal coherence length Transport Tunnel Secondary Slits Diagnostics Split X-ray pulse and control the delay Split and Delay (MoU DESY) Split and Delay Tailor X-ray spatial profile ( < 50 microns ) X-ray Focusing Lenses Secondary Slits Tailor X-ray intensity and spectrum Attenuators Diagnostics Tailor X-ray repetition rate Pulse Picker Focusing Lenses Tailor X-ray spectrum Harmonic Rejection Mirrors Photon Shutter Characterize X-ray pulse intensity Intensity Monitor Attenuators Characterize X-ray spatial profile Profile Monitor Pulse Picker Characterize incident X-ray intensity before Non-destructive Intensity FEH Hutch 4 Harm. Rej. Mirrors optical component of before sample Monitor Defining Slits Diagnostics Sample orientation and alignment Diffractometer Diffractometer Large Angle Position X-ray area detector and minimize air Detector Stage Large Angle Detector Stage absorption and air scattering Measure X-ray speckle patterns 2D Detector (BNL) XCS Instrument @ LCLS Aymeric ROBERT 7 7 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
XCS Instrument Overview 4 h c t u H Vestibule Hutch 4 Optics, Diffractometer Large Angle detector Mover Split and Delay Area X-ray Transport Tunnel Post-Monochromator Large Offset Monochromator XCS Instrument @ LCLS Aymeric ROBERT 8 8 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
MID Instrument @ E-XFEL workshop XCS Instrument @ LCLS PPS Photon Shutter Valve LUSI Slit System LUSI Intensity Monitor LUSI Profile Monitor Transport Tunnel LUSI Monochromators LUSI Slits System LUSI Position Monitor Photon Stopper Complete XCS Layout Valve Split and Delay Unit LUSI Slits System LUSI Position Monitor Vestibule Photon Stopper Valve LUSI Slits System 9 9 LUSI Position Monitor PPS Photon Shutter Valve LUSI Attenuators LUSI Pulse Picker CXI LUSI Slits System FEH Hutch 4 LUSI Slits System aymeric@slac.stanford.edu LUSI Position Monitor Aymeric ROBERT Diffractometer Wide Angle Detector Stage Beam Dump
Intensity – Position Monitor Photon Shutter Primary Slits Diagnostics Monochromators Transport Tunnel Secondary Slits Diagnostics Split and Delay Secondary Slits Diagnostics Focusing Lenses Photon Shutter • Purpose: Attenuators – Per-pulse normalization of experimental signals Pulse Picker – High-resolution beam position monitoring FEH Hutch 4 Harm. Rej. Mirrors Defining Slits • Specifications: Diagnostics – Highly transmissive (< 5% loss) Diffractometer – Relative accuracy < 0.1% Large Angle Detector Stage – Dynamic range 1000 – Per-pulse op. at 120 Hz XCS Instrument @ LCLS Aymeric ROBERT 10 10 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
Slits Photon Shutter Primary Slits Diagnostics Monochromators Transport Tunnel Pink beam Secondary Slits Low-Z High-Z Diagnostics Split and Delay Mono beam D=3 mm High-Z Secondary Slits Diagnostics Focusing Lenses Photon Shutter Attenuators • Purpose: Pulse Picker – Defines the beam size & position FEH Hutch 4 Harm. Rej. Mirrors – Clean up scatterings (halo) around beam perimeter Defining Slits Diagnostics • Specifications: Diffractometer – Can withstand full LCLS flux – unfocused Large Angle Detector Stage – Minimize background scatter from blades – 0.5 μ m accuracy XCS Instrument @ LCLS Aymeric ROBERT 11 11 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
Profile - Intensity Monitor Photon Shutter Primary Slits Diagnostics Monochromators Transport Tunnel Secondary Slits Diagnostics Split and Delay Secondary Slits Diagnostics Focusing Lenses Photon Shutter Attenuators • Purpose: Pulse Picker – Coarse beam alignment/monitoring; Coarse/fine beam profile FEH Hutch 4 Harm. Rej. Mirrors Defining Slits • Specifications: Diagnostics – Destructive; Retractable Diffractometer Large Angle At 100 μ m resolution - 24x24 mm 2 field of view; – Detector Stage At 8 μ m resolution - 2x2 mm 2 field of view – – Capable of per-pulse op. @ 120 Hz XCS Instrument @ LCLS Aymeric ROBERT 12 12 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
X-ray Focusing Lenses Photon Shutter Primary Slits Diagnostics Monochromators Transport Tunnel Secondary Slits Diagnostics Split and Delay Secondary Slits Diagnostics Focusing Lenses Photon Shutter Attenuators • X-ray Focusing Lens System Pulse Picker – Down to 2 μ m beam waist FEH Hutch 4 Harm. Rej. Mirrors – Variable spot size from 2-10 μ m Defining Slits and 40-60 μ m when working out of Diagnostics focus Diffractometer – Can withstand full LCLS flux Large Angle Detector Stage – Variable lens to sample distance B. Lengeler et al., J. Synchrotron Rad. , 6, 1153-1167 (1999). XCS Instrument @ LCLS Aymeric ROBERT 13 13 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
Attenuator - Pulse Picker Photon Shutter Primary Slits Diagnostics Monochromators Transport Tunnel Secondary Slits Diagnostics Split and Delay Secondary Slits Diagnostics Focusing Lenses Photon Shutter Attenuators • LUSI Attenuator\Pulse Picker System Pulse Picker – Excellent Optical Quality FEH Hutch 4 Harm. Rej. Mirrors – > 3 steps per decade of attenuation above 6 keV Defining Slits > 10 12 attenuation < 17 keV Diagnostics – Isolate 3 rd harmonic from fundamental Diffractometer – Large Angle Detector Stage – Tailor rep rate up to 10 Hz XCS Instrument @ LCLS Aymeric ROBERT 14 14 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
Attenuator - Pulse Picker Photon Shutter Primary Slits Diagnostics Linear Stage Monochromators Transport Tunnel 2 x Rotatable Flange Secondary Slits Diagnostics Split and Delay Shutter Assembly Mirror Secondary Slits PP Viewport, near & far side Viewport Diagnostics 10 x Filter/Actuator Assembly + Focusing Lenses Y + Photon Shutter + Z 6 Degree of Freedom Support Attenuators X Pulse Picker Mirror/Actuator FEH Hutch 4 Harm. Rej. Mirrors Assembly Defining Slits Diagnostics Diffractometer Large Angle Detector Stage XCS Instrument @ LCLS Aymeric ROBERT 15 15 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
Attenuator - Pulse Picker Photon Shutter Primary Slits Diagnostics Monochromators Transport Tunnel Secondary Slits Diagnostics Split and Delay Secondary Slits Diagnostics Focusing Lenses Photon Shutter Attenuators 1.25” Pulse Picker FEH Hutch 4 Harm. Rej. Mirrors Defining Slits Diagnostics Diffractometer Large Angle Detector Stage XCS Instrument @ LCLS Aymeric ROBERT 16 16 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
Harmonic Rejection Mirrors Photon Shutter Y AXIS Y Primary Slits STAGE ROTARY STAGE Diagnostics N O I T C E R I D M A Monochromators E B Transport Tunnel Y STAGE MOUNT SILICON Secondary Slits MIRROR Diagnostics Split and Delay KINEMATIC MOUNT Secondary Slits Diagnostics X Focusing Lenses Z 2X “X” AXIS Photon Shutter STAGE Attenuators A • Harmonic Rejection Mirror Pulse Picker System FEH Hutch 4 Harm. Rej. Mirrors B – Good optical quality Defining Slits Diagnostics – Si single crystal C Diffractometer – 300 mm Large Angle Detector Stage – No prefigure, no bender XCS Instrument @ LCLS Aymeric ROBERT 17 17 MID Instrument @ E-XFEL workshop aymeric@slac.stanford.edu
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