The Coherent X-ray Imaging (CXI) Instrument at LCLS Sébastien Boutet SLAC National Accelerator Laboratory October 28, 2009 CXI Instrument at LCLS Sébastien Boutet 1 1 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
Outline LCLS Front-end optics Coherent X-ray Imaging (CXI) Instrument Hutch Diagnostics Optical System Sample Environment Detector Summary CXI Instrument at LCLS Sébastien Boutet 2 2 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
Ultrafast Coherent Diffractive Imaging of Biomolecules One pulse, one measurement Noisy diffraction pattern X-ray pulse Combine 10 5 -10 7 measurements into 3D dataset Gösta Huldt, Abraham Szöke, Janos Hajdu (J.Struct Biol, 2003 02- ERD-047) CXI Instrument at LCLS Sébastien Boutet 3 3 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
CXI Capabilities CXI instrument not only designed for biological imaging Suitable for imaging any object in forward scattering Not suitable for Bragg geometry XPP, XCS instruments at LCLS can be used for that Other techniques compatible with CXI SAXS / WAXS Protein crystallography Nanocrystal studies Solution scattering CXI Instrument at LCLS Sébastien Boutet 4 4 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
LCLS Source LCLS energy range (fundamental) : 800 – 8265 eV 3 rd harmonic up to 24.9 keV (1% of the fundamental) Repetition rate: 120 Hz Parameter Value Value Value Value Value Units Photon energy 24795 8265 6000 4000 2000 eV Wavelength 0.05 0.15 0.21 0.31 0.62 nm Source size (FWHM) 60 60 67 73 78 µm CXI Hutch distance from 385.5 385.5 385.5 385.5 385.5 meters undulator exit Source divergence 0.73 1.1 1.34 1.89 3.47 µrad (FWHM) Pulse duration ~70 ~70 ~70 ~70 ~70 fsec Number of photons 1.7E+10 1.7E+12 2.7E+12 4E+12 8E+12 photons CXI Instrument at LCLS Sébastien Boutet 5 5 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
X-ray Transport Optics & Diagnostics Soft X-ray Offset Mirror System (SOMS) selects 800-2000 eV range for soft X-ray line Hard X-ray Offset Mirror System (HOMS) reflects up to 25 keV. 385 mm clear aperture mirrors � <70% transmission at 2 keV and >98% at 8.3 keV Offset mirror systems separate FEL beam from spontaneous background and removes high harmonics CXI instrument uses the hard x-ray branch ~3-25 keV Measured unfocused AMO beam 800 eV Spontaneous Beam FEL beam CXI Instrument at LCLS Sébastien Boutet 6 6 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
LCLS Instruments Near Experimental Hall http://lcls.slac.stanford.edu/Instruments.aspx AMO SXR X-ray Transport Tunnel XPP D i s t a n c e f r o m S o u r c e = 4 4 0 CXI m XCS Endstation AMO: Atomic, Molecular and Optical science SXR: Soft X-ray Research MEC XPP: X-ray Pump-Probe XCS: X-ray Correlation Spectroscopy CXI: Coherent X-ray Imaging Far Experimental Hall MEC: Matter under Extreme Conditions CXI Instrument at LCLS Sébastien Boutet 7 7 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
Far Experimental Hall CXI Control Room Lab Area XCS Control Room m 0 2 Matter in Extreme Conditions Instrument X-ray Correlation Spectroscopy Coherent X-ray Imaging Instrument Instrument CXI Instrument at LCLS Sébastien Boutet 8 8 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
Coherent X-ray Imaging (CXI) Instrument Insert compact 0.1 micron system in empty drift space between 1 micron KB mirrors and focal plane Interaction region 2 Interaction region 1 Diagnostics/Slits Diagnostics & Wavefront Monitor 1 micron Sample Environment 0.1 micron KB & Sample Environment 1 micron KB (inside thermal enclosure) CXI Instrument at LCLS Sébastien Boutet 9 9 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
Diagnostics and Common Optics Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Focusing Lenses Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits Requirement Device 0.1 µm KB Mirrors 0.1 µm Sample Environment Remove X-ray beam halo X-ray Guard Slits FEH Hutch 5 Particle Injector Ion TOF-MS Tailor X-ray intensity Attenuators Detector Stage Tailor X-ray repetition rate Pulse Picker Guard Slits Focusing Lenses Characterize X-ray pulse intensity Intensity Monitor Diagnostics 1 µm Sample Environment Characterize X-ray spatial profile Profile Monitor Particle Injector Ion TOF-MS Characterize X-ray focus Wavefront Monitor Detector Stage Tailor focal spot size to the sample X-ray Focusing Lenses Wavefront Monitor Beam Dump CXI Instrument at LCLS Sébastien Boutet 10 10 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
CXI Reference Laser Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Focusing Lenses Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Vacuum chamber cover/laser cover Diagnostics removed/sectioned for clarity Guard Slits 0.1 µm KB Mirrors Purpose 0.1 µm Sample Environment FEH Hutch 5 Particle Injector Rough alignment of the experiment without the X-ray Ion TOF-MS beam Detector Stage Guard Slits Provides a visible line to align components Focusing Lenses Requirements Diagnostics 1 µm Sample Environment Useable with any part of the instrument vented to air Particle Injector Ion TOF-MS Window valves Detector Stage Aligned to the unfocused FEL beam to within 100 microns Wavefront Monitor Beam Dump CXI Instrument at LCLS Sébastien Boutet 11 11 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
CXI 1 µm KB Mirrors Guard Slits Diagnostics XRT Photon Shutter Attenuators Pulse Picker Focusing Lenses Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits Purpose 0.1 µm KB Mirrors Produce a 1 µm focus 0.1 µm Sample Environment FEH Hutch 5 Focal lengths Particle Injector Ion TOF-MS 8.7 m for M1 8.3 m for M2 Detector Stage Requirements Guard Slits 350 mm clear aperture Focusing Lenses Diagnostics 3.4 mrad maximum incidence angle 1 µm Sample Environment SiC coating Particle Injector <1 nm rms height error over entire mirror Ion TOF-MS Detector Stage 2-11 keV energy range Space for 2 coating strips KB focusing also provides harmonic rejection Wavefront Monitor Beam Dump CXI Instrument at LCLS Sébastien Boutet 12 12 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
CXI Sample Chamber Position apertures and Guard Slits samples on grids Diagnostics Particle Injector XRT Piezoelectric stages in- Photon Shutter vacuum Attenuators 3 aperture stages for Long range Pulse Picker noise reduction microscope 5-axis sample stage for Focusing Lenses mounted samples High Vacuum Reference Laser 10 -7 mbar to minimize Guard Slits noise from air scatter Diagnostics Large exit flange for large Guard Slits detector 1 µm KB Mirrors Rapid access with large Diagnostics door Guard Slits Large volume for flexibility 0.1 µm KB Mirrors On-axis sample viewing 0.1 µm Sample Environment FEH Hutch 5 Particle Injector Using long-range Ion TOF-MS microscope and mirror Detector Stage with hole Guard Slits 2-3 micron resolution Focusing Lenses Multiple laser ports Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Pump Beam Dump CXI Instrument at LCLS Sébastien Boutet 13 13 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
CXI Sample Chamber Front view Back view Particle Injector Long range microscope Beam Mirror Large Door CXI Instrument at LCLS Sébastien Boutet 14 14 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
Sample Chamber Interior Apertures on 5-axis sample piezo stages stage Beam Many apertures are needed to measure signal at small angles CXI Instrument at LCLS Sébastien Boutet 15 15 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
CXI Sample Chamber (Internal Views) Front view Back view Beam Apertures on piezo stages 5-axis sample stage Mirror with hole Beam for sample viewing CXI Instrument at LCLS Sébastien Boutet 16 16 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
CXI Detector Guard Slits Diagnostics Collaboration with XRT Photon Shutter Attenuators the Gruner Group Pulse Picker at Cornell Focusing Lenses Reference Laser University Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics 2D Pixel Array Detector Guard Slits High resistivity Silicon (500 µm) for direct x-ray conversion. 0.1 µm KB Mirrors 0.1 µm Sample Environment Reverse biased for full depletion. FEH Hutch 5 Particle Injector Bump-bonding connection to CMOS ASIC. Ion TOF-MS <1 photon readout noise Detector Stage 110x110 µm 2 pixels Guard Slits Focusing Lenses 1520x1520 pixels Diagnostics 10 3 dynamic range 1 µm Sample Environment Particle Injector 120 Hz readout Ion TOF-MS Detector Stage Tiled detector, permits variable ‘hole’ size Wavefront Monitor Beam Dump CXI Instrument at LCLS Sébastien Boutet 17 17 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
Detector Modules and Quadrant Rafts CXI Instrument at LCLS Sébastien Boutet 18 18 MID Workshop, ESRF, October 28 2009 sboutet@slac.stanford.edu
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