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Mar 05, 2024 •686 likes •839 views

Yablonovitch limit PVMD Arno Smets Delft University of Technology Learning objectives How is absorption enhancement limit derived What assumptions underlie this limit Absorption enhancement in a c-Si solar cell Enhancement by

Yablonovitch limit PVMD Arno Smets Delft University of Technology
Learning objectives • How is absorption enhancement limit derived • What assumptions underlie this limit • Absorption enhancement in a c-Si solar cell
Enhancement by texturing Air Silicon
Enhancement by texturing Air Silicon
Enhancement by texturing R Air Silicon L
Enhancement by texturing R Air R Silicon L
Enhancement by texturing and back reflector Air Silicon
Enhancement by texturing and back reflector R * Air Silicon L *
Enhancement by texturing and back reflector R * R * Air Silicon L *
Assumptions theoretical limit Assumptions: Anti reflection coating • R front =0 (implementing surface nano-texture) Scattering at textured interfaces • Lambertian (decoupling front- and backside texture scattering morphologies) Back reflector • R back =1 (replacing metallic back reflector with dielectric back reflector)
Enhancement c-Si solar cell Front nano-texture 1.0 2 µm DBR 0.8 Ag 0.6 A Si Thermal SiO 2 Bulk c-Si 0.4 20 μ m 0.2 2 µm 0.0 400 400 600 600 800 800 1000 1000 1200 1200 1.28 μ m DBR T DBR 2 Wavelength (nm) J PH T DBR = 0.54 mA/cm A Ag 2 J PH A Ag = 0.40 mA/cm Back micro-texture A. Ingenito, O. Isabella, M. Zeman, ACS Photonics , 1, 270−278 (2014) TU Delft
Enhancement c-Si solar cell in practice 1.0 0.8 R, Absorptance, Losses (-) R , Absorptance, Losses [-] 190 µm 0.6 R (3.60 mA/cm 2 ) Emitter (3.81 mA/cm 2 ) Al-BSF (0.06 mA/cm 2 ) 0.4 Si-Al (4.31 mA/cm 2 ) Bulk (32.65 mA/cm 2 ) Simulated EQE (34.68 mA/cm 2 ) 0.2 Measured EQE (34.71 mA/cm 2 ) 0.0 400 500 600 700 800 900 1000 1100 1200 Wavelength (nm) Wavelength [nm] A. Ingenito, O. Isabella, M. Zeman, SOLMAT 123, 17-29, 2014. (TU Delft)
Assumptions: R • R Air R front =0 • Lambertian scattering Silicon • R back =1 L 1.0 R, Absorptance, Losses (-) 0.8 R , Absorptance, Losses [-] R * R * Air 0.6 R (3.60 mA/cm 2 ) Emitter (3.81 mA/cm 2 ) Silicon Al-BSF (0.06 mA/cm 2 ) 0.4 Si-Al (4.31 mA/cm 2 ) Bulk (32.65 mA/cm 2 ) L * Simulated EQE (34.68 mA/cm 2 ) 0.2 Measured EQE (34.71 mA/cm 2 ) 0.0 400 500 600 700 800 900 1000 1100 1200 Wavelength (nm) Wavelength [nm]

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