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Status of the Test-Station for Silicon-Strip-Detectors in Bonn Max Becker HISKP, University of Bonn PANDA Collaboration Meeting, T urin, 16. June 2009 1 Table of Contents 1. Bonn T est-Station 2. Tracking-Station 3. New Mezzanine ADC 4.


  1. Status of the Test-Station for Silicon-Strip-Detectors in Bonn Max Becker HISKP, University of Bonn PANDA Collaboration Meeting, T urin, 16. June 2009 1

  2. Table of Contents 1. Bonn T est-Station 2. Tracking-Station 3. New Mezzanine ADC 4. Sensor T est @ ELSA with photons 2

  3. Bonn Test-Station Lab Setup in Bonn • Si-strip sensor box with Supply Board • VME-Crate with FPGA Board • New Mezzanine 65MSPS ADC • PC 3

  4. Bonn Test-Station Sensor-L-Boards • L-shape for double sided mounting • Sensor  Pitch Adaptor  Front-Ends (APV25) • Sensor: Size 2x2 cm², Pitch 50µm, 385 strips (n-side), 385 strips (p-side) 4

  5. Bonn Test-Station Data T aking ADC Mezzanine 3 APVs Supply Board 111110000011010011010010101010101010101 001010101010010110101010101010100101010 111010001010101010001010010001010100101 FPGA Board FIFO Ethernet VME CPU PC • Analog data from APVs sampled by the ADC • ADC data stored in FIFO • FIFO readout from VME-CPU • Process sends data via Ethernet to PC 5

  6. Bonn Test-Station Data Analysis • Supply Board voltages • Front-End parameters • Noise, pedestals, hit pattern • Pulseheight-Spectrum • Continuous updates from Bonn, Dresden & Mainz using common code repository 6

  7. Tracking-Station • Four sensor boxes for tracking • x-y-z movement • Measurement of multiple scattering for various materials • Possible operation @ ELSA, COSY, GSI ... 7

  8. New Mezzanine ADC • ADC output written to FIFOs in FPGA • FPGA readout via VME • Transfer from VME crate to PC via Ethernet • Next: FPGA based pedestal subtraction, hitfinder, noise... 8

  9. Sensor Test @ ELSA with photons Setup behind Crystal Barrel 9

  10. Sensor Test @ ELSA with photons Goals: • First test with photons (up to 2.35GeV) from an accelerator • Observation of the leakage current in the sensor (temperature - & photon flux dependency) • Monitoring data outside the lab (Energy-loss, noise & channel positions with photons) Results: • Sensor survived & operated well • Leakage current behaves as expected 10

  11. Sensor Test @ ELSA with photons Hits on the sensor: simulation vs. measurement Broken APV Measured energy loss: 11

  12. Sensor Test @ ELSA with photons Leakage current and ... ...photon count ...temperature 0,000350 9,00E+11 0,000350 28 8,00E+11 27 0,000300 0,000300 7,00E+11 26 6,00E+11 0,000250 0,000250 25 5,00E+11 4,00E+11 24 0,000200 0,000200 3,00E+11 23 2,00E+11 0,000150 0,000150 22 1,00E+11 0,000100 21 0,000100 0,00E+00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 : : : : : : 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 : : : : : : 12 0 0 0 0 0 0 9 9 9 9 9 9 0 0 0 0 0 0 0 0 0 0 0 0 9 9 9 9 9 9 . . . . . . 5 5 5 5 5 5 0 0 0 0 0 0 0 0 0 0 0 0 . . . . . . 5 5 5 5 5 5 . . . . . . 6 8 0 2 4 6 0 0 0 0 0 0 0 0 1 1 1 1 . . . . . . 6 8 0 2 4 6 0 0 1 1 1 1

  13. Sensor Test @ ELSA with photons Measured and Normalized leakage current predicted temperature and photon count dependend part of leakage current 9,00E+11 2500 1,80E-07 0,000400 8,00E+11 1,60E-07 0,000350 2000 7,00E+11 1,40E-07 6,00E+11 1,20E-07 0,000300 1500 5,00E+11 1,00E-07 0,000250 4,00E+11 8,00E-08 1000 3,00E+11 6,00E-08 0,000200 2,00E+11 4,00E-08 500 0,000150 1,00E+11 2,00E-08 0,00E+00 0 13 0,00E+00 0,000100 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 : : : : : : : : : : : : 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 9 9 9 9 9 9 9 9 9 9 9 9 0 0 0 0 0 0 0 0 0 0 0 0 . . . . . . . . . . . . 5 5 5 5 5 5 5 5 5 5 5 5 0 0 0 0 0 0 0 0 0 0 0 0 . . . . . . 6 8 0 2 4 6 . . . . . . 6 8 0 2 4 6 0 0 1 1 1 1 0 0 1 1 1 1

  14. Summary / What's next? Summary: • Modular test setup for Si-strip sensors • Full DAQ / preprocessing / reconstruction chain works What's next? • Implement double sided sensor boards in our test setup • Construct a Tracking-Station & modify the DAQ for tracking 14

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