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Data recording, reduction and processing Manfred Roessle EMBL Hamburg Outline Recording of Small Angle Scattering (SAS) data SAXS Variety: Laboratory Sources and Synchrotron based SAXS Beamlines What makes SAXS Beamlines special? X-rays in


  1. Data recording, reduction and processing Manfred Roessle EMBL Hamburg

  2. Outline Recording of Small Angle Scattering (SAS) data SAXS Variety: Laboratory Sources and Synchrotron based SAXS Beamlines What makes SAXS Beamlines special? X-rays in and X-rays out: From the source to the detector (via the sample?) Seeking and finding: What detects what? Primary Data Reduction 1-dim is 1-dim Everything has to be normalized! Subtracting nothing from something a bit more than nothing The beauty of SAXS (raw) data What the hell does this all mean? Initial parameters to judge the success of the experiment Automated SAXS data recording and analysis Let’s have a beer, we are automated! 2 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  3. SAXS Synchrotron based At all running synchrotron source are SAXS beamlines available! At all new constructed synchrotrons SAXS beamlines are planned! All SAXS beamlines are highly oversubscribed and “working horses” on their facilities! The scientific applications ranging from soft condensed matter, nano-science and fiber diffraction on ordered biological systems up to structural biology in solution. SPring 8, Hyogo HASYLab, Hamburg ESRF, Grenoble APS, Chicago Diamond, Didcot Petra III, Hamburg Soleil, Orsay 3 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  4. SAXS Lab sources Bruker NanoStar Bruker NanoStar Anton Paar SAXSess Rigaku S-Max3000 Hecus SAXSeye 4 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  5. The Electromagnetic Spectrum 5 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  6. Radiation from Synchrotron Storage Rings Production of X-rays Bending magnet Necessary part of a synchrotron. Many of these dipole magnets form the synchrotron storage ring. The electrons (positrons) are deflected and accelerated in the magnetic field. This acceleration generates the synchrotron light. The light is emitted tangential to the electron beam. Wiggler Stack of magnetic dipoles. Put into the straight sections of the storage ring. Wigglers produces more light than bending magnets in a smaller source size. Undulator Most powerfull insertion device! A stack of magnetic dipoles generate a high flux of photons in a very small source size. The specific arrangement of the dipoles (d=n* λ ) produces a discrete spectrum with coherent properties. http://www.physics.uwa.edu.au 6 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  7. Radiation from Synchrotron Storage Rings Dipole bending magnet (APS) 7 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  8. Properties of X-rays from Synchrotron Sources 1. High flux of photons High heat load and radiation damage! 2. Tangentially emitted with a Beamsize increases with distance from central cone such like a source point! spotlight 3. Polychromatic light from Scattering/Diffraction experiments need infrared to X-rays monochromatic light! X-ray optics for: 1. Beam defining 2. Focusing 3. Monochromatization 8 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  9. X-ray optics Beam defining Beam defining by slit pairs: Problem: Every edge cutting the beam produces parasitic scattering! Refractive streaks at low angles impedes SAXS experiments! Solution: Successive slit systems. First slits cutting the beam and second system cuts out the undesired parasitic scattering Slit system 1 Slit system 2 Beam defining Beam cleaning to detector from source From Glatter & Kratky 1982 Small Angle Scattering Book online available! http://physchem.kfunigraz.ac.at/sm/Index.html Or google “Otto Glatter” For slits exposed to high head load, cooling is necessary 9 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  10. X-ray optics Focusing The glancing angle for X-rays on surfaces are very small. Only under grazing conditions X-ray mirrors Reflectivity for Rh@8keV can be used for focusing. 1 0.9 0.8 0.7 reflectivity 0.6 Bending of the highly 0.5 0.4 polished mirror surface 0.3 permits focusing on the 0.2 0.1 parabolic mirror profile 0 0 0.2 0.4 0.6 0.8 1 angles [deg] In order to use the full beam size X-ray mirrors on synchrotrons are typically in the range of 30cm to 1m. The grazing angle can be increased by using high Z-elements (e.g. Rhodium, Platin, Nickel) as reflecting surface. These mirrors are acting as well as high energy filter; important for monochromatization 10 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  11. X-ray Optics Monochromator Monochromatization of the X-ray is achieved by using single crystals in Bragg diffraction geometry ( ) n λ = Θ 2 d sin 2 Θ Θ Θ Θ For instance a Si 111 crystal with d-spacing (=distance Θ between the crystal lattice) of Θ d=3.14 Å deflects the beam for a wavelength of λ λ =1 Å to Θ ~ λ λ 10°(9.16° ). Problem: The Bragg condition is also fulfilled for multiple orders of the wavelength n. These higher order have to be filtered by the X-ray mirror 11 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  12. X-ray optics X33 mirror X33 monochromator 1m Rh coated on Zerodur substrate Si 111 single crystal in asymmetric cut This device is also used for horizontal focusing. 12 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  13. Detectors for SAXS Seeking and finding Fiber optic tapered CCD cameras for X-rays . + fast readout (10Hz framing possible) + large area possible - low dynamic range - sensitive to overexposing - spatial correction due to the fiber optic taper - intrinsic background of CCD chip 13 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  14. Detectors for SAXS Seeking and finding Novel pixel detectors PILATUS system Swiss light source + high dynamic range (10 20 phot/s!!!) + no intrinsic background + fast framing Ideal detector for solution scattering! 500k model was installed successfully at X33 and upgraded to a 1M prototype 14 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  15. X33-Beamline Schematic Not to scale Experimental Hutch Optics Hutch + + Hutch Wall SAXS WAXS Sample Attenuator Detector Detector Area BM4 BM3 BM2 Aperture Camera Tube BM1 Shutter SS4 SS3 SS2 Mirror SS1 Mono PS Source 1.5m 1.2m 0.1m 2.2m 2.5m 0.7m 0.9m 1.1m 21.4m 2.7m 31.6m PS – Primary Slit SS – Secondary Slits BM – Beam Monitor 15 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  16. Schematic X33 SAXS setup Beamshutter with diode for Beamstop with diode for measurement measurement of Pilatus WAXS detector up to 13° of transmitted beam incident beam q~10 nm -1 d~ 6 Å (prior to exposure) � � � � � � 1000 mm � � � � Sample cell 1400 mm s: 0.1 nm -1 to 4.3nm -1 d : 65 nm to 15 nm 16 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  17. EMBL’s X33 Beamline 17 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  18. Data Reduction From 2-dim to 1-dim Radial (azimuthal) averaging: The 2-dim detector intensities are stored as a images with three values: d Intensity counts; pixel X and pixel Y I(x,y) The x=0 and y=0 position can be determined by the concentric diffraction cycles of Silver Behenate powder. 1e+5 1e+4 Intensity 1e+3 1e+2 0 200 400 600 800 1000 1200 1400 1600 1800 2000 2200 2400 Channels 18 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  19. Radial Averaging Log I(s) Normalization against: • data collection time, • concentration, • transmitted sample intensity. s, nm -1

  20. Data Reduction Assigning the s-axis 1e+12 1e+11 π 2 1 1e+10 Intensity ( ) = λ Θ = s sin 2 1e+9 d 1e+8 1e+7 0 500 1000 1500 2000 2500 Channels 5 Peak order d-spacing s-value d-Channel 4 1 st order 5.834 nm 1.076 nm -1 495 s-value [nm -1 ] 3 2 nd order 2 2.917 nm 2.153 nm-1 995 1 3 rd order 1.944 nm 3.231 nm -1 1400 0 0 500 1000 1500 2000 4 th order Peak position [Channels] 1.458 nm 4.304 nm -1 1990 20 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  21. Background subtraction Standard protocol: 1. Measurement: Buffer 2. Measurement: Protein 3. Measurement: Buffer We are looking to protein signals of less than 0.5% above the back- ground level! 21 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  22. Primary Data Analysis Judging the data quality First experiment BSA standard solution This standard is used for calibration and has to be freshly prepared and measured. 22 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

  23. First test Quality check on intensity data Ideal solution of particles Repulsive particle interactions Attractive particle interactions 23 26.10.2010 EMBO Workshop on solution scattering EMBL Hamburg 25.10 to 01.11.2010

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