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Flash Memory For Automative 2016 10 Do not distribute without permission 1 2007 2 2011 6th 3 2015 9th 4 Automotive Flash 5 NAND for Automotive More storage requires NAND Navigation, ADAS,


  1. Flash Memory For Automative 이에프텍 2016 10 Do not distribute without permission 1

  2. 2007 년 시작 2

  3. 2011 년 6th 3

  4. 2015 년 9th 4

  5. Automotive Flash 5

  6. NAND for Automotive • More storage requires NAND – Navigation, ADAS, Infotainment and Black-box • NAND is acceptable for the dashboard or a head unit – Under -20C to 85 • Data retention on high temperature is critical issue 장치의 장착위치 저장온도 동작온도 직사광선 노출 안됨 85C 75C 직사광선 노출 근처 95C 85C 직사광선 노출 115C 105C

  7. Data retention loss For 19nm MLC (Multi-Level Cell) NAND the acceleration factors for retention • degradation are 6.5 at 55 ° C and a fatal 168 at 85 ° C which means that stored data is definitely corrupted after a few months without additional countermeasures. 출처 :

  8. AEQ-Q100 • High Temp Program/Erase Endurance Cycling • 85C, cycling for 15% of product life time : 1/3 time on full area, 3/1 time on 10% area, 1/3 time on the rest of area (90%) – High Temp Data Retention(HTDR) • Example) 150C bake 40 hr – High Temp Operating Life (HTOL) • 90C R/W for 408 hours OR 70C R/W for 1000 hours • High speed • Low Temp Program/Erase Endurance Cycling procedure • 55C, cycling for 15% of product life time – Low Temp Data Retention(HTDR) procedure

  9. Customer Requirement 테스트명 시나리오 High Temp 85C, Read/Write, 2000Hours Low Temp -25C, Read/Write, 100Hours Cross Temp -25~85C 1000cycle, Read/Write High Temp+SPOR 85C 2000Hours with SPOR 5K

  10. EFTech Industrial eMMC/SD Tester Test solution for industrial eMMC/SD • – Smart test cases and monitor/control GUI program – Chamber & test board Working temperature test with high speed interface • – AP based chamber solution for 128 para – Working temperature : -40C to 120C Industrial Tester overview • – Functional/power-cycle test – endurance/retention test with burn-in – Performance benchmark 10

  11. Recent Test Result for automotive SD • All Sdcards of 5 makers could not pass our room temp SPOR test – Power cycle test fails within 100 ~ 1K – Write/read timeout with SPOR • Recommendation : Buy S-Sdcard or T-Sdcard on Gmarket !!

  12. System Configuration of NAND application • Navigation : Map-SD and OS-embedded flash – eMMC on Wince/linux – MLC NAND + S/W FTL + Wince/linux • Is it Strong FTL ? • Driver Monitoring system – SoC + SLC NAND in one chip package

  13. Automotive & Robotics • New Market & New Challenge ABB Industrial Robot Softbank PePe 13

  14. New S/W Tech Endurance(X) : Retention(Y) : Performance(Z) Target Specific Requirement 14

  15. Q&A : lauren@elixirflash.com 15

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