Evaluation of 50 m square pixel detector with test ASIC for the - PowerPoint PPT Presentation

Evaluation of 50 μm square pixel detector with test ASIC for the HL-LHC ATLAS upgrade Yamanaka Group M2 Daiki Yamamoto 2017 年 山中研・久野研合同年末発表会 1

LHC-ATLAS Experiment ATLAS detector 44m LHC （ Large Hadron Collider ） 25m pixel silicon detector 1442mm 430mm 2

Beam Test goal tracking resolution must be efficiency study of pixel detector ü structure effect less than 10 μm 50 μm pixel detector get track of particle telescope 3

Beam Test @Fermilab proton (120GeV) 4

Experimental Setup 〜 70cm Tilt SVX4 telescope 5

SVX4 telescope track reconstruction 6

� Merit of Tilting the Sensors tilted vertical thickness 300 µm width 50 µm signal can be detected more than 1 strip at only 1 strip ⇨ $% resolution 𝜏 = centroid method hit position &' ~14[µm] this time, tilted sensors by 10 degree 7

Data Processing Hit Selection charge hit threshold Clustering strip # cluster GetLocalPosition 8

Alignment GetGlobalPosition target residual Shift track track position y position y Rotation track track position x position x 9

Residual Distribution (after alignment) 1 st layer 2 nd layer 3 rd layer 4 th layer residualX2 residualX2 residualX0 residualX0 residualX1 residualX1 residualX3 residualX3 residualX2 residualX0 residualX1 residualX3 2200 2200 Entries 18705 Entries 17030 2000 Entries 17039 Entries 18724 2200 1800 Mean -0.3672 Mean 0.2321 2000 Mean 0.00946 Mean 0.4358 2000 RMS 8.46 2000 RMS 8.103 1800 RMS 9.294 RMS 7.271 1600 1800 Underflow 29 Underflow 15 Underflow 10 1800 Underflow 28 1800 χ 1600 χ 2 / ndf 2 / ndf 3.06 / 5 4.607 / 5 χ χ 2 / ndf 7.139 / 5 2 / ndf 5.754 / 6 X 1400 1600 1600 Prob 0.4657 Prob 0.6908 1600 Prob 0.2105 Prob 0.4513 1400 ± ± Constant 2266 26.9 Constant 1840 23.9 1400 ± ± Constant 2130 26.0 Constant 1996 23.6 1200 1400 1400 ± ± Mean -0.1862 0.0768 ± Mean 0.1159 0.1128 ± 1200 Mean 0.1766 0.0919 Mean 0.06194 0.07683 1200 ± ± Sigma 6.099 0.113 Sigma 7.272 0.199 ± 1200 Sigma ± 1000 Sigma 5.994 0.110 1200 6.977 0.133 1000 1000 1000 1000 800 800 800 800 600 σ:7.2 μm σ:6.6 μm σ:6.0 μm σ:5.9 μm 600 600 600 400 400 400 400 200 200 200 200 0 0 0 0 -150 -100 -50 0 50 100 150 -150 -100 -50 0 50 100 150 -150 -100 -50 0 50 100 150 -150 -100 -50 0 50 100 150 -100 0 100 [µm] -100 0 100 [µm] -100 0 100 [ µm] -100 0 100 [ µm] residualY2 residualY2 residualY0 residualY0 residualY1 residualY1 residualY3 residualY3 residualY2 residualY3 residualY0 residualY1 2000 2000 Entries 18705 2200 1800 Entries 18724 Entries 17030 Entries 17039 Mean 0.1119 Mean 0.1411 Mean -0.1624 Mean -0.02642 1800 1800 2000 RMS 11.18 1600 RMS 12.59 RMS 8.704 RMS 7.559 1600 Underflow 84 Underflow 85 1600 Underflow 35 1800 Underflow 36 1400 χ 2 / ndf 24.61 / 9 χ χ 2 / ndf 8.635 / 5 χ 2 / ndf 2.769 / 5 2 / ndf 31.55 / 9 Y 1600 1400 Prob 0.003439 1400 Prob 0.0002384 Prob 0.1245 Prob 0.7355 ± 1200 ± ± Constant 1855 20.8 ± Constant 1895 24.4 Constant 2159 26.5 Constant 1643 19.3 1400 1200 1200 Mean 0.007493 ± 0.072436 ± ± ± Mean 0.00299 0.08931 Mean -0.02973 0.09392 Mean -0.01021 0.07528 ± 1000 ± ± 1200 ± Sigma 7.119 0.086 Sigma 7.947 0.117 Sigma 6.564 0.149 Sigma 5.942 0.109 1000 1000 1000 800 800 800 800 600 σ:6.1 μm σ:7.1 μm 600 σ:7.0 μm σ:7.9 μm 600 600 400 400 400 400 200 200 200 200 0 0 0 0 -150 -100 -50 0 50 100 150 -150 -100 -50 0 50 100 150 -150 -100 -50 0 50 100 150 -150 -100 -50 0 50 100 150 -100 0 100 [µm] -100 0 100 [µm] -100 0 100 -100 0 100 [µm] [µm] 10

� Position Resolution of Sensor Assumption l Track is parallel to the Z axis l Each sensor has almost same resolution ' + 𝜏 >5;?@ ' ' 𝜏 &56789:;< = 𝜏 & layer 𝝉 𝒚 [𝛎𝐧] 𝝉 𝒛 [𝛎𝐧] ' 0 6 6 ' + 𝜏 A ' + 𝜏 B ' 𝜏 ' 1 5 6 ' + = 𝜏 & 3 2 5 6 3 6 7 𝜏 &56789:;< 〜 𝜏 B56789:;< 11

� Analysis of Position Resolution Factors l fluctuation of dE/dx cluster charge according to the FWHM of cluster charge, Charge_dist_0 Charge_Dist_0 Charge_Dist_0 Entries Entries 67832 67832 DE FGF 5000 Mean Mean 2.749e+04 2.749e+04 E FGF 〜 0.2 RMS RMS 1.114e+04 1.114e+04 4000 𝑦 = 𝑦 & 𝑅 & + 𝑦 ' 𝑅 ' 3000 𝑅 & + 𝑅 ' 𝜀𝑅 >W> 2 (𝑥𝑗𝑒𝑢ℎ) 𝑅 & 𝑅 ' 𝜀𝑅 2000 𝜀 K ~ 𝑅 & + 𝑅 ' ' 𝑅 1000 if 𝑅 & = 𝑅 ' , 3 × 10 0 0 20 40 60 80 100 charge[ 10 A 𝑓 V ] 〜 4 μm 0 20 40 l multiple scattering 〜 2 μm l noise of ADC 〜 1 ADC 〜 1 ke (this effect is included in δQ) 12

Tracking Resolution Evaluating by weighting of each sensor resolution 𝝉 𝒚V𝒖𝒔𝒃𝒅𝒍 [𝛎𝐧] 𝝉 𝒛V𝒖𝒔𝒃𝒅𝒍 [𝛎𝐧] 3 3 ü Enough resolution ( ＜ 10 μm ) for evaluating pixel sensor 13

FE65 pixel detector 14

track vs hit Correlation hit x[um] hit y[um] CorrelationX_track_vs_hit CorrelationY_track_vs_hit CorrelationX_track_vs_hit CorrelationX_track_vs_hit CorrelationY_track_vs_hit CorrelationY_track_vs_hit 20 Entries Entries 1046 1046 Entries Entries 1046 1046 25 3000 3000 Mean x Mean x 4869 4869 Mean x Mean x 9514 9514 18 Mean y Mean y Mean y Mean y 1543 1543 1838 1838 Std Dev x Std Dev x 1128 1128 Std Dev x Std Dev x 1309 1309 16 2500 2500 Std Dev y Std Dev y Std Dev y Std Dev y 827.3 827.3 841.2 841.2 20 14 2000 2000 12 15 10 1500 1500 8 10 1000 1000 6 4 5 500 500 2 0 0 0 0 1000 2000 3000 4000 5000 6000 7000 8000 9000 6000 7000 8000 9000 10000 11000 12000 13000 track x [um] track y [um] 15

Residual Histogram ResidualX_track_hit ResidualY_track_hit ResidualX_track_hit ResidualX_track_hit ResidualY_track_hit ResidualY_track_hit Entries Entries 3028 3028 Entries Entries 3028 3028 80 Mean Mean 3533 3533 Mean Mean 1.157e+04 1.157e+04 140 Std Dev Std Dev 20.45 20.45 Std Dev Std Dev 21.58 21.58 70 120 60 100 50 80 40 60 30 40 ~50 μm (1 pixel size) ~50 μm (1 pixel size) 20 20 10 0 0 3440 3460 3480 3500 3520 3540 3560 3580 3600 3620 11450 11500 11550 11600 11650 11700 track – hit x [um] track – hit y [um] 16

To Do • Draw Hit Efficiency map like this 17

Backup 18

High Luminosity LHC ATLAS 実験の目的 HL-LHC により u Higgs 粒子の精密測定 高統計を期待 u 超対称性粒子の探索 HL-LHC 現在 現在の 5 倍 の輝度 19

HL-LHC における検出器への要求 High Luminosity より細かい目のピクセル 5 倍の粒子密度 新型 ASIC 搭載 50μm 角ピクセル検出器 Integrated Luminosity 高放射線耐性 1.7×10 &$ [𝑜 6a /𝑑𝑛 ' ] 陽子線照射後、 相当のダメージ ビームを用いて性能評価 ＠ピクセル 3 層目 20

Silicon Strip Sensor (Telescope) 13mm strip sensor 15.4 width 50 μm 8 sensors mm # of strip 256 (x, y) thickness 300 μm ↓ 4layer SVX4 chip ü charge readout （ 8bit ADC ） ü 128ch 21

� � � 位置分解能とノイズ 𝑦 ' − 𝑦 & = 50 𝜈𝑛 ストリップ間隔 、 𝜀𝑅 & = 𝜀𝑅 ' とする 𝑦 = 𝑦 & 𝑅 & + 𝑦 ' 𝑅 ' 𝑅 & + 𝑅 ' ' ' 𝜖𝑦 𝜖𝑦 ' + ' 𝜀𝑦 = 𝜀𝑅 & 𝜀𝑅 ' 𝜖𝑅 & 𝜖𝑅 ' ' ' 𝑥𝑅 ' −𝑥𝑅 & ' + ' = 𝜀𝑅 & 𝜀𝑅 ' 𝑅 & + 𝑅 ' ' 𝑅 & + 𝑅 ' ' 𝑥𝜀𝑅 & 𝑅 & + 𝑅 ' ' − 2𝑅 & 𝑅 ' = 𝑅 & + 𝑅 ' ' 22

Convert ADC to Charge ü Evaluate pedestal of each strips ü charge = (ADC-pedestal) × gain charge[ 10 A 𝑓 V ] channel vs charge 0xy channel vs adc 0x channel vs adc 0y ADC charge:channel_index {layer_index==0} × 3 10 250 charge 3 10 200 200 200 150 2 10 100 100 100 10 50 0 0 0 1 200 strip# 200 strip# 0 100 200 300 400 500 0 100 400 strip# 0 100 channel_index 0 100 200 300 1chip X Y 23