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/ E T . Significance scans of E miss /H T and E miss T T Mariyan Petrov University of Oxford mpetrov@cern.ch November 6, 2016 Mariyan Petrov (Oxford) Oxford November 6, 2016 1 / 28 Table of Contents 1 Introduction 2 Significance 3

  1. / � E T . Significance scans of E miss /H T and E miss T T Mariyan Petrov University of Oxford mpetrov@cern.ch November 6, 2016 Mariyan Petrov (Oxford) Oxford November 6, 2016 1 / 28

  2. Table of Contents 1 Introduction 2 Significance 3 Tables 4 Modelling 5 Jet pT scan 6 Conclusion Mariyan Petrov (Oxford) Oxford November 6, 2016 2 / 28

  3. Introduction I Follow up from last week 1. We showed a significant decrease in the Zjets background by introducing an additional selection 2. The two selections under consideration are E miss /H T > 0 . 5 and / or / � E T > 0 . 5 T E miss T 3. Reduction by more than 50% 4. However some reduction in our signal yields 5. Some ”fine-tuning” of the cut may be needed Mariyan Petrov (Oxford) Oxford November 6, 2016 3 / 28

  4. Significance Scan I Significance definition 1. We use the version of the significance adopted by ℓℓνν group 2. That is the version of a counting experiment where the background B is known and treated as constant 3. Following this logic gives us: � Z = 2 × (( S + B ) × log (1 + S/B ) − S ) (1) 4. Where S is the total signal yield after all high/low mass selection and B is the total background for the same selections 5. We scanned through Z for different values of E miss /H T and / � E T T E miss T Mariyan Petrov (Oxford) Oxford November 6, 2016 4 / 28

  5. Significance Scan, Electron (left), Muon (right) Significance Z Significance Z 8 8 7 7 6 6 5 5 ggH1000 ggH300 ggH1000 ggH300 4 4 ggH400 ggH500 ggH400 ggH500 ggH600 ggH700 ggH600 ggH700 ggH800 ggH900 ggH800 ggH900 3 3 ZHinv ZHinv 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 miss miss E /H E /H T T T T Mariyan Petrov (Oxford) Oxford November 6, 2016 5 / 28

  6. Significance Scan, Electron (left), Muon (right) 9 9 Significance Z Significance Z 8 8 7 7 6 6 5 5 4 4 3 3 ggH1000 ggH300 ggH1000 ggH300 2 2 ggH400 ggH500 ggH400 ggH500 ggH600 ggH700 ggH600 ggH700 1 1 ggH800 ggH900 ggH800 ggH900 ZHinv ZHinv 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 ∑ ∑ miss miss E / E E / E T T T T Mariyan Petrov (Oxford) Oxford November 6, 2016 6 / 28

  7. Tables of Yields I High Mass Yields 1. The total background decreases by 12 . 8% ( 21 . 5% ) for / � E T > 0 . 5 ) E miss /H T > 0 . 5 ( E miss T T 2. The 600GeV signal decreases by 7 . 2% ( 13% ) for E miss /H T > 0 . 5 / � E T > 0 . 5 ) T ( E miss T 3. The error on the total background decreases by 40% Mariyan Petrov (Oxford) Oxford November 6, 2016 7 / 28

  8. Tables of Yields II Low Mass Yields 1. The total background decreases by 8 . 2% ( 22% ) for E miss /H T > 0 . 5 / � E T > 0 . 5 ) T ( E miss T 2. The 600GeV signal decreases by 1 . 8% ( 9 . 8% ) for E miss /H T > 0 . 5 / � E T > 0 . 5 ) T ( E miss T 3. The error on the total background decreases by 8% ( 21% ) for / � E T > 0 . 5 ) E miss /H T > 0 . 5 ( E miss T T Mariyan Petrov (Oxford) Oxford November 6, 2016 8 / 28

  9. Nominal Yields I Sample Yield Error Sample Yield Error ggH300NW 49.52 1.22 ggH300NW 45.54 1.17 ggH600NW 37.82 0.33 ggH600NW 39.32 0.34 ggH1000NW 20.49 0.17 ggH1000NW 22.81 0.18 TotalBkg 276.87 4.41 TotalBkg 259.10 3.47 Table: Nominal high mass final yields in Electron (Left) and Muon (right). Sample Yield Error Sample Yield Error ZHinv 24.83 0.57 ZHinv 23.54 0.56 TotalBkg 419.12 8.50 TotalBkg 391.58 10.38 Table: Nominal low mass final yields in Electron (Left) and Muon (right). Mariyan Petrov (Oxford) Oxford November 6, 2016 9 / 28

  10. High Mass Yields I Sample Yield Error Sample Yield Error ggH300NW 47.31 1.20 ggH300NW 43.85 1.15 ggH600NW 35.12 0.32 ggH600NW 36.42 0.33 ggH1000NW 19.63 0.17 ggH1000NW 21.74 0.18 TotalBkg 241.57 2.82 TotalBkg 225.79 2.40 Table: Final yields after E miss /H T > 0 . 5 in Electron (Left) and Muon (right). T Sample Yield Error Sample Yield Error ggH300NW 40.70 1.11 ggH300NW 37.45 1.06 ggH600NW 32.89 0.31 ggH600NW 34.27 0.32 ggH1000NW 19.13 0.17 ggH1000NW 21.21 0.18 TotalBkg 216.28 2.43 TotalBkg 204.51 2.23 / � E T > 0 . 5 in Electron (Left) and Muon (right). Table: Final yields after E miss T Mariyan Petrov (Oxford) Oxford November 6, 2016 10 / 28

  11. Low Mass Yields I Sample Yield Error Sample Yield Error ZHinv 24.35 0.57 ZHinv 23.14 0.56 TotalBkg 382.92 7.65 TotalBkg 360.95 9.76 Table: Final yields after E miss /H T > 0 . 5 in Electron (Left) and Muon (right). T Sample Yield Error Sample Yield Error ZHinv 22.41 0.54 ZHinv 21.19 0.52 TotalBkg 322.43 5.66 TotalBkg 309.37 9.35 / � E T > 0 . 5 in Electron (Left) and Muon (right). Table: Final yields after E miss T Mariyan Petrov (Oxford) Oxford November 6, 2016 11 / 28

  12. Modelling of � E T I Modelling � E T is mismodelled, it’s not anything new Its connected with the general pile up modelling A few questions on the breakdown of terms Most importantly jet and soft terms I don’t have up to date plots currently, but the important behaviour can be seen with 8 . 5fb − 1 Mariyan Petrov (Oxford) Oxford November 6, 2016 12 / 28

  13. Jet � E T , Electron (left), Muon (right) Mariyan Petrov (Oxford) Oxford November 6, 2016 13 / 28

  14. Soft � E T , Electron (left), Muon (right) Mariyan Petrov (Oxford) Oxford November 6, 2016 14 / 28

  15. Scan of Jet p T I Changing jet p T threshold 1. We use the version of the significance adopted by ℓℓνν group 2. We scanned through Z for different values of the jet p T (cut fixed for both leading and sub − leading) 3. We restricted the scan to the VBF signal region 4. The total background in Z includes the ggH signal as background Mariyan Petrov (Oxford) Oxford November 6, 2016 15 / 28

  16. Shape comparison for Jet p T , Electron (left), Muon (right) 0.35 0.35 a.u a.u VBF 600 GeV VBF 600 GeV VBF 600 GeV 0.3 0.3 Total Background Total Background Total Background 0.25 0.25 0.2 0.2 0.15 0.15 0.1 0.1 0.05 0.05 0 0 0 10 20 30 40 50 60 70 80 90 100 0 10 20 30 40 50 60 70 80 90 100 jet jet p [GeV] p [GeV] T T Mariyan Petrov (Oxford) Oxford November 6, 2016 16 / 28

  17. Yields variation with Jet p T , Electron (left), Muon (right) VBF Event Yields VBF Event Yields 9 7 8 6 600 mass point, Electron Ch. 600 mass point, Muon Ch. 7 5 6 Signal Background Signal Background 5 4 4 3 3 2 2 1 1 0 0 20 30 40 50 60 70 80 90 20 30 40 50 60 70 80 90 jet jet p [GeV] p [GeV] T T Mariyan Petrov (Oxford) Oxford November 6, 2016 17 / 28

  18. Scan of Jet p T , Electron (left), Muon (right) Significance Z Significance Z 1.4 1.4 VBF 300 VBF 400 VBF 300 VBF 400 1.2 VBF 500 VBF 600 VBF 500 VBF 600 1.2 VBF 700 VBF 800 1 VBF 700 VBF 800 1 VBF 900 VBF 1000 VBF 900 VBF 1000 0.8 0.8 0.6 0.6 0.4 0.4 0.2 0.2 20 30 40 50 60 70 80 90 20 30 40 50 60 70 80 90 jet jet p [GeV] p [GeV] T T Mariyan Petrov (Oxford) Oxford November 6, 2016 18 / 28

  19. Summary Conclusions / � E T and We can reject more Z+jets background with the E miss T E miss /H T T / � E T rejects more background but E miss E miss /H T accepts more T T signal and better modelling I am in favour for a cut of > 0 . 5 , as this removes more Zjets background The settling factor is probably a limit setting with each cut and observe how the limit changes To do: Currently working on making new ntuples, running into difficulties in production of ntuples Currently working on limit setting for ggF and VBF Mariyan Petrov (Oxford) Oxford November 6, 2016 19 / 28

  20. Backups Mariyan Petrov (Oxford) Oxford November 6, 2016 20 / 28

  21. High mass event yields, E miss /H T , Electron (left), Muon T (right) VBF Event Yields VBF Event Yields 300 600 Gev mass, Electron 600 Gev mass, Muon 250 250 Signal Background Signal Background 200 200 150 150 100 100 50 50 0 0 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 miss miss E /H E /H T T T T Mariyan Petrov (Oxford) Oxford November 6, 2016 21 / 28

  22. Low mass event yields, E miss /H T , Electron (left), Muon T (right) VBF Event Yields VBF Event Yields 400 350 ZHinv, Electron ZHinv, Muon 350 300 Signal Background Signal Background 300 250 250 200 200 150 150 100 100 50 50 0 0 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 miss miss E /H E /H T T T T Mariyan Petrov (Oxford) Oxford November 6, 2016 22 / 28

  23. / � E T , Electron (left), High mass event yields, E miss T Muon (right) VBF Event Yields VBF Event Yields 300 600 Gev mass, Electron 600 Gev mass, Muon 250 250 Signal Background Signal Background 200 200 150 150 100 100 50 50 0 0 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 ∑ ∑ miss miss E / E E / E T T T T Mariyan Petrov (Oxford) Oxford November 6, 2016 23 / 28

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