COMPARISON OF FOUR DATA ANALYSIS SOFTWARE FOR COMBINED X-RAY REFLECTIVITY AND GRAZING INCIDENCE X-RAY FLUORESCENCE MEASUREMENTS Bérenger Caby (1) , Fabio Brigidi (2) , Dieter Ingerle (3) , Blanka Detlefs (1) , Gaël Picot (1) , Luca Lutterotti (2) , Emmanuel Nolot (1) , Giancarlo Pepponi (2) , Christina Streli (3) , Magali Morales (4) , Daniel Chateigner (5) (1) CEA, LETI, MINATEC Campus, Grenoble, France (2) Fondazione Bruno Kessler, Trento, Italy (3) Atominstitut, Vienna University of Technology, Vienna , Austria (4) CIMAP , Caen , France (5) CRISMAT-Ensicaen, IUT-Caen UCBN, Caen, France
OUTLINE � GiXRF – XRR combined analysis � Comparison of 4 data analysis software � GIMPY, JGIXA, MAUD, MEDEPY � Main features � Key differences � Material Database � Sample definition � Instrumental function � XRR simulation � GiXRF simulation � Fitting capabilities � Summary and outlook | 2
NON-DESTRUCTIVE ELEMENTAL DEPTH PROFILING WITH X-RAYS � Analysis of (ultra)thin layered films for advanced applications (micro/nano electronics, memory, photonics, PV, …) � Analytical challenges � Reduced material quantities � limits of detection � Material properties different from bulk � non-existent standards � Analysis of interfaces and buried layers � destructive or indirect methods � Accuracy, standardization � Need for non-destructive depth-profiling method � Avoid artifacts (preferential sputtering, atom mixing, implantation) � Limited (if any) degradation of the sample � On beamlines, in the Labs, … in R&D cleanrooms, in industry � Combined GIXRF/XRR ? | 3
GIXRF+XRR ANALYSIS | 4
GIXRF+XRR DEPTH PROFILING Propagation of GiXRF-XRR requires : � X-ray dedicated tools � Optimized protocols � Fundamental parameters (cross sections, absorption coefficients), densities, XSW � Data reduction software enhancement � Thicknesses of layers to fit � Quantification of the XRF dose (geometrical factors) � Same model for XRR and GiXRF : increase the level of information. Add constraints & reduce uncertainties | 5
ANALYSIS SOFTWARE SOFTWARE AUTHORS KEY FEATURES REFERENCES TXRF’15 : Frid. 10.10 am GIMPY G. Pepponi, F. XRR, XRF, GiXRF • Brigidi Integrated intensities Grazing Incidence Material analysis with Python D. Ingerle XRR, GiXRF • Spectrochimica Acta Part B 99 JGIXA (2014) 121–128 Integrated intensities • TXRF’15 : Wed. 3.30 pm L. Lutterotti XRR, XRF, GiXRF, XRD • Nuclear Inst. and Methods in MAUD Physics Research, B, 268, 334- Full spectrum Material Analysis 340, 2010 Using Diffraction • http://maud.radiographema.c om/ B. Detlefs, G. XRR, GIXRF, XSW • TXRF’15 : Frid. 9.30 am MEDEPY Picot, E. Nolot, Integrated intensities Material Elemental DEpth profiling H. Rotella … using PYthon | 6
OVERVIEW � Common points � XRR based on Parrat formalism (L. G. Parratt, Phys. Rev., vol. 95, no. 2, p.359, 1954) � GiXRF based on De Boer formalism (D. K. G. de Boer, http://dx.doi.org/10.1103/PhysRevB.44.498) � Key differences � XRF : full spectrum vs integrated intensity � Additional SW (e.g PyMCA) is required to extract the integrated XRF intensities for each angle / each XRF line � Material database � Sample definition � Instrumental function � Other features (simulation & fitting modules) | 7
MATERIAL DATABASE The values of parameters such as: � Fluorescence yield, Atomic scattering factors, Photoelectric, elastic and inelastic scattering cross sections … may not be constant over publications / material database SOFTWARE MATERIAL DATABASE GIMPY, JGIXA, MAUD • https://data-minalab.fbk.eu/txrf/xraydata/element/ MEDEPY • User defined • Xray Lib (http://ftp.esrf.eu/pub/scisoft/xraylib/readme.html) | 8
MATERIAL DATABASE NiO 2 (5nm, d=6.0g/cc) Ni (50 nm, d=8.9 g/cc) Si (sub, d=2.33 g/cc) | 9
SAMPLE DEFINITION SOFTWARE PARAMETERS REMARKS GIMPY, JGIXA Thickness • No correlation between mass Roughness density and stoichiometry Mass density Stoichiometry MAUD Thickness • XRD-based definition of the Roughness sample structure Phase • Compatible with XRR- Stoichiometry GiXRF-XRD combined analysis Thickness • Mass density and MEDEPY Roughness stoichiometry are correlated Mass density or atomic density • GENX-based definition Stoichiometry | 10
SAMPLE DEFINITION (MAUD) | 11
INSTRUMENTAL FUNCTION � � XRR GiXRF � Divergence ~ overall resolution � Divergence (convolution ~ approximation …) � Geometrical correction | 12
GEOMETRICAL CORRECTION � Geometrical correction � Acceptance function (detected area corrected by solid angle of detection) � Spatial intensity distribution of the incident beam ( e.g gaussian) theta-theta configuration Detector angle = 90 ° W. Li et al, Review of Scientific Instruments 83 , 053114 (2012) | 13
GEOMETRICAL CORRECTION theta-theta configuration theta-2theta configuration Detector angle ≠ 90 ° Detector angle ≠ 90 ° | 14
ACCEPTANCE FUNCTION � JGIXA � Rectangular function (width L d ) � Parameter = L d � 1/cos( θ ) correction for θ -2 θ geometry � GIMPY, MEDEPY � Parameters d 1 , d 2 , d p � Heumans lambda function (solid angle of detection) � Independent (resp. dependent) of theta in θ - θ (resp. θ -2 θ ) geometry | 15
GEOMETRICAL CORRECTION W Li et al, Review of Scientific Instruments 83 , 053114 (2012) GIMPY MEDEPY | 16
SIMULATION XRR simulation GiXRF simulation For NiO 2 /Ni/Si sub case study where thicknesses, densities and roughness were varied and when using the same database : • the simulated XRR data obtained with the 4 different software were found almost perfectly identical • the simulated GiXRF data obtained with the 4 different software on a « perfect » tool (no divergence, no instrumental function) were found almost perfectly identical Impact of the instrumental function • Limited discrepancy induced by (overall divergence) is almost perfectly divergence identical for the different software • Significant impact of the geometrical correction • Only GIMPY includes secondary fluorescence… | 17
FITTING CAPABILITIES SOFTWARE CAPABILITIES REMARKS • Fitting module under development GIMPY • Combined fitting of XRR • Fast and user friendly JGIXA and GiXRF datasets acquired • Monochromatic primary radiation at the same energy MAUD • Unique capability for XRR- • Full spectrum only XRD-GiXRF combined • GiXRF instrumental function to be analysis corrected ! • Stoichiometry • Monochromatic and polychromatic primary radiation • Combined fitting of various • Monochromatic primary radiation MEDEPY XRR and GiXRF datasets • Still under optimization (definition of acquired at various energies FOM for combined analysis …) • Stoichiometry | 18
SUMMARY AND OUTLOOK � Analysis of (ultra)thin layered films for advanced applications (micro/nano electronics, memory, photonics, PV, …) � Need for combined GIXRF/XRR as a non-destructive depth-profiling method � On beamlines, in the Labs, … in R&D cleanrooms, in industry � GiXRF/XRR software � 4 powerful software have been tested � Need for standardization (reduced instrumental function …) in order to meet the needs for depth-dependent quantitative analysis in Labs, R&D facilities and industry | 19
Thank you for your attention!
Recommend
More recommend
