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Analog Input/Output Subsystem Design Reference: STM32F4xx Reference Manual (ADC, DAC chapters) Analog input subsystem Property being measured convert property to input electrical voltage/current transducer signal produce


  1. Analog Input/Output Subsystem Design Reference: STM32F4xx Reference Manual (ADC, DAC chapters)

  2. Analog input subsystem Property being measured convert “property” to input electrical voltage/current transducer signal produce convenient voltage/current conditioning levels over range of interest sample hold value during conversion & hold analog to digital conv. Digital value to CPU

  3. Analog output subsystem Digital value from CPU convert binary code to an digital to analog voltage/current analog conv signal produce convenient voltage/current conditioning levels over range of interest output transducer/ convert electrical signal to actuator mechanical or other property Property being controlled

  4. Typical analog input subsystem Property1 Property2 PropertyN convert “property” to input input input electrical voltage/current transducer transducer transducer … produce convenient signal signal signal voltage/current levels conditioning conditioning conditioning over range of interest mux select channel sample STM32L1xx hold value during conversion & hold --------------- 16 channels, Analog to 12-bit ADC convert analog value to digital # digital conv. Digital value

  5. Analog subsystem properties  Accuracy: degree to which measured value differs from true value  Resolution/precision: degree to which two conditions can be distinguished Related to #bits in digital value   Range: minimum to maximum “useful” value  Linearity: y = Ax + B (correction req’d if not linear)  piecewise linear approximation over different ranges  Repeatability: same measurement for a given value  affected by hysteresis or other phenomena  Stability: value changes other than due to the property being measured (eg. T affecting P)

  6. Analog to digital conversion errors May need to correct in software Gain error Offset error Quantization error: Difference between digital & analog values Usually want ± ½ LSB Nonlinearity error - Unequal distances between transition points

  7. Transducers  Convert physical quantity to electrical signal  Self-generating – generates voltage/current signal  Non-self-generating – other property change (ex. R)  Examples:  Force/stress (strain gage)  Temperature (thermocouple, thermistor, semicond.)  Pressure  Humidity (gypsum block)  Smoke  Light (phototransistor, photoconductive cell)  Acceleration (accelerometer)  Flow  Position (potentiometer, displacement)

  8. Temperature sensors  Thermocouple – “Seeback EMF produced by heating junction of dissimilar metals ( μ V) + V -  Thermistor – mix of materials in ceramic [ ] − 1 / T 1 / To β = R R e t 0 •Negative temperature coefficient: R^ with Tv •Linear over small range  Metal conductor: = + α − R t R [ 1 ( T T )] 0 0 •Positive temp. coefficient: R^ with T^

  9. Semiconductor temperature sensor Base-emitter voltage approximately proportional to T Vcc   kT Ic = V BE ln   -   ≈V BE q Is + V BE ∝ T V BE V BE

  10. Analog Devices AD590 Temperature Transducer I T  IC generates current proportional to temperature  Generated current I T is linear: 1 μ a/ o K Example: Design a temperature monitor with output in the range [0v..4v] over temperature range [-20 o C .. +60 o C] (Use summing amplifier)

  11. Strain Gage  Measure stress by measuring change or resistance of a conductor due to change of its length/area   Lo = ρ A   R   Ao L  Compression: L decreases, A increases  Elongation: L increases, A decreases ∆ R / R  “Gage factor” (sensitivity): = S ∆ L / L

  12. Wheatsone bridge  Measure small resistance changes     R Rs = −     Vo V V + + ref ref     R R R Rs   1 Rs = − V   + ref   2 R Rs “Balanced”: Vo = 0 when R=Rs Some pressure sensors use bridge with all 4 R’s variable

  13. Signal conditioning  Produce noise-free signal over “working” input range  Amplify voltage/current levels  Bias (move levels to desired range)  Filter to remove noise  Isolation/protection (optical/transformer)  Common mode rejection for differential signals  Convert current source to voltage  Conditioning often done with op amp circuits

  14. Operational amplifiers  Amplifier types:  Inverting amplifier  Non-inverting amplifier  Summing amplifier  Differential amplifier  Instrumentation amplifier  Tradeoffs  Inverting/noninverting  High input impedance  Defined gain  Comon mode rejection

  15. Basic op amp configurations Noninverting amplifier Inverting amplifier   R 2 Vi Vo =   = − Vi Vo +   R 1 R 2 R 1 R 2 + Vo R 2 R 1 R 2 = − = Vo / Vi Vi R 1 R 2 Noninverting version has high input impedance

  16. Summing amplifier V 1 V 2 Vo + = − R 1 R 2 R 3 Potential application: V1 = input voltage V 1 V 2 = − + Vo R 3 ( ) V2/R2 provide an “offset” to V1/R1 R 1 R 2 (ex. to produce Vo=0 at some V1 value)

  17. Differential amplifier Eliminates “common mode” voltage (noise, etc.) − − − V 1 Vx Vx Vo V 2 Vx Vx = = R 1 R 2 R 1 R 2 + R 1 V 0 R 2 V 1 V 2 R 2 = = Vx Vx + + R 1 R 2 R 1 R 2 R 2 = − Vo ( V 2 V 1 ) R 1 Choose R1 to set input impedance; R2 to set gain

  18. Instrumentation amplifier - + - +  +    2 R 2 R 4 = −   Vo ( V 2 V 1 ) 1       R 1 R 3 •High input impedance, common mode rejection •Can match R2, R3, R4 on chip and use external R1 to set gain

  19. Sample-and-hold converter V in C  Required if A/D conversion slow relative to frequency of signal:  Close switch to “sample” Vin (charge C to Vin) Aperture (sampling) time = duration of switch closure   Open switch to “hold” Vin

  20. Analog to digital conversion  Given: continuous-time electrical signal v(t), t >=0  Desired: sequence of discrete numeric values that represent the signal at selected sampling times : v(0), v(T), v(2T),…v(nT)  T = “sampling time”: v(t) “sampled” every T seconds  n = sample number  v(nT) = value of v(t) measured at the n th sample time and quantized to one of 2 k discrete levels

  21. A/D conversion process v(t*) v(t) Sampled signal Input signal T 2T 3T 4T 5T 6T 7T t t* v(nT) Sampled & quantized (3/4)V ref Sampled data sequence: n= 1 2 3 4 5 6 7 (2/4)V ref d=10, 10, 10, 10, 11, 11, 11 (1/4)V ref Binary values of d, where (0/4)V ref v ( nT ) = (d/4)V ref n 1 2 3 4 5 6 7

  22. A/D conversion parameters  Sampling rate, F (sampling interval T = 1/F)  Nyquist rate ≥ 2 x (highest frequency in the signal) to reproduce sampled signals  CD-quality music sampled at 44.1KHz  (ear can hear up to about 20-22KHz) Voice in digital telephone sampled at 8KHz   Precision (# bits in sample value)  k = # of bits used to represent sample values  “precision”: each step represents (1/2 k )×V range Ex. Temperatures [-20 O C…+60 O C]: if k=8, precision = 80 O C/256 = 0.3125 O C   “accuracy”: degree to which converter discerns proper level (error when rounding to nearest level)

  23. Analog to digital conversion  More difficult than D/A conversion  Tradeoffs:  Precision (# bits)  Accuracy  Speed (of conversion)  Linearity  Unipolar vs. bipolar input  Encoding method for output  Cost  Often built around digital to analog converters

  24. Digital to analog conversion Number = b n b n-1 …b 1 b 0 = b n *2 n + b n-1 *2 n-1 + …. + b 1 *2 1 + b 0 *2 0 (Reference) R-2R Ladder Network Current to voltage conversion Equivalent resistance = R Equivalent resistance = R I/2 n+1

  25. Flash A/D conversion  N-bit result requires 2 n comparators and resistors: Comparator output = 1 if Vin > Vref*(N/2 n ) V ref (N = 1, 2, …. 2 n-1) V in n-bit encoder output   − n ( 2 1 ) R   = V Vref *   n   2 R Identify bit at which Comparators ... comparator outputs change from 1->0. “Thermometer code” – bottom k bits = 1, upper 2 n-1 -k bits = 0

  26. Dual-slope conversion  Use counter to measure time required to charge/discharge capacitor (relatively low speed).  Charging, then discharging eliminates non-linearities (high accuracy).  Relatively low cost -V ref comparator - V in + clock control counter n-bit output

  27. Dual-slope conversion steps SW1 connects Vin for fixed time T 1. C charges with current = Vin(t)/R  T T 1 1 T ∫ ∫ = − = − = − Vo ( t ) i ( t ) dt Vin ( t ) dt Vin c C RC RC 0 0 -Vo(t) Constant slope Slope α Vin T t 1

  28. Dual-slope conversion steps SW1 connects –Vref until Vo discharges to 0. 2. C discharges with constant current = -Vref/R  + T t T 1 1 1 ∫ ∫ + = − + Vo ( T t ) Vin ( t ) dt V dt 1 ref RC RC 0 T When Vo(T+t1) = 0:  + T t T 1 1 1 ∫ ∫ = Vin ( t ) dt V dt ref RC RC 0 T   t -Vo(t) =   1 Vin Vref   T Constant slope Slope α Vin Use a counter to measure t1. T t 1

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