PI Photovoltaic-Institute Berlin Company portrait of PI-Berlin - PowerPoint PPT Presentation

PI Photovoltaic-Institute Berlin Company portrait of PI-Berlin Photovoltaic Module Technology Testing | Consulting | Research

At a glance Name: PI Photovoltaic-Institute Berlin (share holding company) Inscription: 10/12/2006 Investment: 1.2 Mio € (80% for lab equipment) Location: c/o TU Berlin, Einsteinufer 25, D-10587 Berlin, Germany Phone/Fax: +49 30 3142 5977 / +49 30 3142 6617 Founders: 9 PV-Specialists from industry and research Workforce: 4 Senior Consultants (in 2007: 15 workers) Milestones: • Foundation October 2006 • Cooperation contract TU Berlin February 2007 • Start of lab Q1 2007 • Own R&D projects Q4 2007

Persons Senior Consultants und Board of Directors: Dr.-Ing. Jürgen Arp , Engineer-Economist in mechanical engineering Experience: Sputnik Engineering Inverters, Abastrial Solar Consulting Berlin Dr. rer. nat. Paul Grunow , Physicist Experience: Founder of Solon AG, Q-Cells AG Prof. Dr.-Ing. Stefan Krauter , Electrical Engineer Experience: Professor at TU Berlin and UFRJ/UECE Brazil, Director of Rio Solar Ltd., LAREF, RIO 02/3/5/6 Dipl.-Ing. Sven Lehmann , Electrical Engineer Experience : Energiebiss, Solon AG, SolarExperts Berlin Head of supervisory board : Prof. Dr. Rolf Hanitsch (TU, EE)

Laboratory Equipment (Q1 2007) Testing - Class A flasher and spectral response set-up for precision measurements - Climatic chambers 2m x 3m x 2m (heat-damp, thermal cycling, humidity freeze) - Continuous light simulator class C (Hot spot, degradation) - Outdoor measurement test site - UV test - Wet leakage isolation test, Dielectrimeter - Mechanical testing (load, twist, hail, scratch) - Bypass diode reverse load test - (fire test stage) Characterization & Development - Laminator - IR-camera for failure detection - Soldering lab - 2 additional characterization set-ups (n.n.) Fig.1: Out-door measurement set-up in Berlin

Laboratory in April 2007 Climatic Climatic 23.4 m Climatic chamber 2 chamber 3 chamber 1 humidtiy- humidity- temperature cold heat cycling cycling cycling table Load 7.7 m 2.8 m Laminator table Unlod Simul. -State- Steady test UV

The three pillars of PI‘s business Testing of modules - Power at Standard Test Conditions STC (Class A simulator) - Energy yield (Temperature, non-perpendicular and low irradiance performance, Spectral effects, degradation) - Reliability (combined test cycles according to IEC 61215/IEC 61646) Consulting in module technology - Product-Assessment und market analyses - Failure analysis - Training (Product manger, distribution, developers) R&D in module technology - New materials and production processes for thin film encapsulation - advanced connection technology for cells based on wafers (thin, back contact) - Quality safeguard for module production

Service 1: Measurements (Q1 2007) Precision measurements modules up to 2 x 1.4 m² < ± 3% Standard measurements modules up to 2 x 1.4 m² > ± 3% Isolation test (6,000 V): wet leakage Spectral response module or cell EVA curing analysis > 5g EVA Load tests (UV, mechanical load, hail) Climatic tests (Temperature cycles, damp-heat, damp-cold)  Pre-testing for IEC 61215/61730 and IEC 61646 with multiple cycles for product comparison

Power output prediction via operation model ( → Research → Service) S tandard T est C onditions STC: PV module power output at 25 ° C, 1,000 W/m², AM 1.5 g direct Typical measurement duration: 10ms non-STC • Temperature performance • Non-perpendicular incidence • Low irradiance level • Spectral effects • Degradation and regeneration -> electrical energy yield (kWh/a kW p ) Is predictable for silicon technology For thin film technology more difficult: Indoor test ≠ outdoor performance [Krauter &Grunow 21th PVSEC (2006), p.2065]

Temperature effects module eff. Tkoeff Pmax coeff. Current coeff. Voltage coff FF NOCT a-Si (triple) 5.3% 0.11%/K -0.32%/K 0.02%/K 45.1 -0.20%/K a-Si (tandem) 5.2% 0.07%/K -0.30%/K 0.03%/K 49.0 -0.20%/K CdTe 7.7% 0.05%/K -0.30%/K 0.02%/K 45.1 -0.23%/K a-Si (single) 5.5% 0.09%/K -0.33%/K 0.00%/K 47.7 -0.24%/K DSC 0.8% 0.50%/K -0.30%/K -0.50%/K 40.0 -0.30%/K HIT 15.1% 0.03%/K -0.25%/K -0.08%/K 49.0 -0.31%/K mono Si 11.6% 0.05%/K -0.39%/K -0.08%/K 45.8 -0.41%/K CIS 9.1% 0.04%/K -0.34%/K -0.13%/K 47.0 -0.44%/K multi Si 11.8% 0.05%/K -0.39%/K -0.10%/K 45.0 -0.44%/K multi EFG Si 11.6% 0.10%/K -0.41%/K -0.16%/K 46.3 -0.47%/K Ribbon Si 10.0% 0.06%/K -0.49%/K -0.03%/K 44.0 -0.47%/K mono LGBC 13.3% 0.05%/K -0.45%/K -0.09%/K 47.0 -0.49%/K Apex 7.6% 0.08%/K -0.49%/K -0.12%/K 45.7 -0.52%/K [Photon International 03/2006]

Non-perpendicular incidence 100% 90% 80% Isc/cos  70% 60% Q6L Diamant Q6L Alberino T 50% Q6L Alberino P 40% 0° 10° 20° 30° 40° 50° 60° 70° 80° 90° incident angle  [Grunow et al. 20th EPVSEC (2005) p.2384]

Performance for low irradiance levels calc. cells N = 1.2 European Efficiency 15% Rs = 5.3 m  measured cells 14% calc. modules n= 1.2 Rs = 7.8m  measured modules 13% 1 10 100 1000 R shunt in  (for a 150mm cell) [Grunow et al. 19th EPVSEC (2004), p.2190]

Relative spectral performance vs. AM 1.5 direct 30% a-S i/a-G e a-S i/a-G e a-S i/a-G e a-S i/a-G e 20% µ -S i a-S i/µ -S i C dT e a-S i/µ -S i 10% C dT e µ -S i C IG S C dT e C IG S a-S i/a-G e C dT e µ -S i a-S i/µ -S i a-S i/µ -S i C dT e C dT e C I G S 0% µ -S i a-S i/a-G e C dT e a-S i/a-G e C IG S a-S i/µ -S i m ulti c-S i C IG S a-S i/µ -S i a-S i/µ -S i acidic m ulti c-S i -10% µ -S i µ -S i a-S i/µ -S i m ono c-S i C dT e µ -S i C I G S C IG S µ -S i C I G S -20% a-S i/a-G e -30% direct AM 1.0 direct AM 2.0 direct AM 5.6 diffuse AM diffuse AM diffuse AM diffuse AM 1.0 1.5 2.0 5.6 [Krauter et al. 21th PVSEC (2006), p.2065]

Degradation/Regeneration technology 1h of light soaking at 1,000 W/m² c-si 0.0% a-Si single -0.3% a-Si tandem +0.2% a-Si/µ-Si -0.8% CIS1 -2.2% CIS2 +17.2% CdTe +3.6% [Herrmann, PERFORMANCE IP, ISPRA Workshop on Thin Film Module Technology 8./9. Nov 2006]

Setback analysis of modules via electro- luminescence (use of solar cell as IR-LED)

PI‘s position in the PV market Module Cell Thin film producer producer start up & producer R&D; Testing, Consulting Retailer Product PI-Berlin developer & Investor Operator > Independent testing and certification Institute > R&D – service provider for cost reduction in module technology (=Encapsulation)

Thank you very much ! arp@pi-berlin.com, grunow@pi-berlin.com, lehmann@pi-berlin.com, krauter@pi-berlin.com