Muon Week (09/2007) USC ATLAS Group Meeting Woochun Park September - PowerPoint PPT Presentation

Muon Week (09/2007) USC ATLAS Group Meeting Woochun Park September 14, 2007

Content • Muon efficiency problem at Endcap • New tracking algorithm development. • Installation Progress • CscReconstruction Report • Micromegas

M5 includes CSC chambers

Csc Cluster Reconstruction in new simulation (13.0.2)

Introduction • Gas gain in simulation is reduced from 1.0x10 5 to 0.58x10 5 . • Strip charges are reduced accordingly. • In cluster reconstruction, threshold algorithm is used. We need to make sure that all the parameters are reasonable for the new simulation.

Q L +Q P +Q R Cluster Charge Distribution

Cluster Charge Distribution on #strips Black Line : 3 strips Blue Line : 4 strips Red Line : 5 strips Q L +Q P +Q R • The more cluster charge distribution spreads, the more strips in cluster.

#Strips of Cluster Depending on Cluster Charge 12.0.6 thr=20k max=5 13.0.20 thr=16k max=5

ClusterStatus Depending on Cluster Charge 12.0.6 thr=20k max=5 13.0.20 thr=16k max=5 Unspoiled Edge Multipeak Narrow Wide Skewed Inconst. % 0 2 3 4 5 6 11 12.0.6 85.6/0.7 1.8/0.1 0.1/0.0 1.0/0.1 7.9/0.2 1.0/0.1 2.6/0.1 13.0.20 83.5/0.6 1.7/0.1 0.3/0.0 2.5/0.1 7.2/0.2 1.4/0.1 3.6/0.1

Pull Width Dependence 13.0.20 Unpoiled + Spoiled Clusters Unpoiled Clusters Measured Strip Position eta

Pull Width Dependence On Calculated Error 13.0.20 12.0.6

Residual on Cluster Charge max : max # strip in cluster 13.0.20 thr=16k max=4 13.0.20 thr=16k max=5 12.0.6 thr=20k max=5 Arrow indicates about 20% height of peak Cosmic result Clusters/(40 ADC counts) 300 0.05<|tan |<0.15 φ 250 200 0.30 Resolution (mm) 0.25 150 0.20 100 0.15 0.10 50 0.05 0 0 500 1000 1500 2000 2500 3000 3500 Cluster Charge (ADC counts) In cosmic data, spoiled clusters are included which make resolution worse at the high tail. Q L +Q P +Q R

Calculated Error vs. Cluster Charge 13.0.20 thr=16k max=4 13.0.20 thr=16k max=5 12.0.6 thr=20k max=5 • Error is smaller than the residual. • Regardless of release, error estimates depending on cluster charges are similar. • This can be shown in pull width dependence on cluster charge in next page. • We may want to introduce additional error which is proportional to cluster charge.

Pull Width Dependence on Cluster Charge max : max # strip in cluster 13.0.20 thr=16k max=4 13.0.20 thr=16k max=5 12.0.6 thr=20k max=5 Q L +Q P +Q R

Good efficiency on Cluster Charge max : max # strip in cluster 13.0.20 thr=16k max=4 13.0.20 thr=16k max=5 12.0.6 thr=20k max=5 Arrow indicates about 20% height of peak Q L +Q P +Q R Good effi 13.0.20 thr=16k max=4 0.992 ± 0.001 13.0.20 thr=20k max=4 0.989 ± 0.001 13.0.20 thr=16k max=5 0.987 ± 0.001 13.0.20 thr=20k max=5 0.986 ± 0.001 12.0.6 thr=20k max=5 0.995 ± 0.001

Good efficiency dependence on #strip and cluster charge 13.0.20 thr=16k max=5 Black Line : 3 strips Blue Line : 4 strips Red Line : 5 strips Q L +Q P +Q R • If cluster has 4 or 5 strips, more chance to be bad measurement.

Good Efficiency and #Strips • The more charges in three strips means that the other strips may contain significant amount of charge in #strips =4 or 5 case. • How about include Q LL and Q RR in Q L and Q R ??

Bad Efficiency on Cluster Charge 13.0.20 thr=16k max=4 13.0.20 thr=16k max=5 12.0.6 thr=20k max=5 Arrow indicates about 20% height of peak Q L +Q P +Q R Mostly from 4 strips and 5 strips (p15) Bad effi 13.0.20 thr=16k max=4 0.008 ± 0.001 13.0.20 thr=20k max=4 0.011 ± 0.001 13.0.20 thr=16k max=5 0.012 ± 0.001 13.0.20 thr=20k max=5 0.014 ± 0.001 12.0.6 thr=20k max=5 0.005 ± 0.001

Spoiled Fraction on Cluster Charge 13.0.20 thr=16k max=4 13.0.20 thr=16k max=5 12.0.6 thr=20k max=5 Arrow indicates about 20% height of peak Q L +Q P +Q R This behavior is understood in page 19. Spoiled Fraction 13.0.20 thr=16k max=4 0.223 ± 0.003 13.0.20 thr=20k max=4 0.206 ± 0.003 13.0.20 thr=16k max=5 0.171 ± 0.003 13.0.20 thr=20k max=5 0.184 ± 0.003 12.0.6 thr=20k max=5 0.144 ± 0.003

Eta Resultion • Position residual is correlated to strip charge amount. The more charges are deposited, the better resolution. Threshold is 16k e - . • • max # strips per cluster = 5(left) and 4(right). • Compared to 41microns in 12.0.6 simulation, the resolution becomes wider. Max=4 Max=5 61.4 µ m 63.2 µ m

Eta Pull Distribution • Threshold is 16k e-. • max # strips per cluster = 5(left) and 4(right). • Compared to 1.004 in 12.0.6 simulation, pull width is comparable. • Red circle indicates contribution of cluster with 5 strips. These cluster gives better residual than others while errors are conservative. Max=4 Max=5

ClusterStatus Depending on Cluster Charge 13.0.20 thr=16k max=5 • ClusterStatus – 0: Unspoiled The more cluster charge, the more failed – 2: Edge owing to too wide. – 3: Multipeak – 4: Narrow – 5: Wide – 6: Skewed – 11: Inconsist.

# Strips Depending on Cluster Charge 13.0.20 thr=16k max=5 Number of strips vs cluster charge. The more cluster charge, the more number strips Orange line indicates cluster has. the current cuts [3-5] for # strips of cluster.

# Strips Depending on Cluster Charge 12.0.6 thr=20k max=5 Number of strips vs cluster charge. The more cluster charge, the more number strips Orange line indicates cluster has. the current cuts [3-5] for # strips of cluster.

Conclusion & To do • Gas gain is reduced to 0.58x10 5 from 1.0x10 5 in Csc simulation (13.0.20). – Cluster charges are decreased accordingly. – No calibration is needed. – Two parameters don’t have to be changed: Strip charge error (4300e) and angular error term (0.57mm) – Less Threshold is suggested (16k as proposal). • Bad fraction is increased by factor of two: – Maximum # strip 4 is considered instead of 5. – Additional error depending on cluster charge may be necessary. – Additional Strips in Charge Ratio Method (Q LL , Q RR ) may be needed. If so, then error will be more conservative. – Then, we need to tune threshold parameter. – Method needs to be developed to discriminate bad cluster from good cluster using variables such as total charge, 4 th strip charge,

To analyze cosmic data • Pedestal and noise information should be accessed through conditionDB for run by run base. • Pedestal for each strip should be subtracted before we do stripFit on sampleCharges. • Noise for each strip is used as a charge measurement error. • Ketevi is working on CalibrationTool package to do this (one week??).

Measurement of Pedestal and Noise • Multiple measurements.

Pedestal Distribution External Pulser Trigger Layer Chamber K. Nikolopoulos University of Athens – Muon Reconstruction Meeting – May 3 rd 2007

Noise Distribution External Pulser Trigger Layer Chamber Noise increase as a function of strip number due to increasing length of strips towards the top of the chamber. K. Nikolopoulos University of Athens – Muon Reconstruction Meeting – May 3 rd 2007

Cosmic 13.0.2 12.0.3

Muon Deterctor for SLHC • Micro Pattern Gas Detector workshop at http://indico.cern.ch/conferenceOtherViews.py?view=standard&confId=16213 • South Carolina is committed to Micromegs R&D (Test beam and proposal). • Beam test scheduled from Oct 17 to Nov 11. Plan to be at CERN around Oct 8. • My job is to participate in beam test, collect data, and analyze them. Hope to report it at NIM. • Refer to J. Wotschack’s presentation at the workshop.