Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring 17 November - 28 November 2014 Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
Primary Photon Photoelectric Effect Incoherent Scattering Fluorescent Compton Compton Photon Photon Auger Electron Electron Coherent Scattering Photoelectron Rayleigh Photon Matter µ = c + i + Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
J. Sherman, Spectrochim. Acta 7 , 283 (1955). T. Shiraiwa and N. Fujino, Jpn. J . Appl. Phys. 5 , 886 (1966). f 1 c 1 , i 1 f 2 c 2 , i 2 I I I I ip s ip s I , c i I ' E ( ) s 2 Sample Reflector E max E 2 max ( E E ´) ~ ~ x 2 I ( E ) Q ( E , E ´) e 2 ~ 1 x 0 i I d E dE ´ ~ i 4 ( E ) ( E ´) G 2 s s 0 0 E max E max 2 ( E E ´) ~ ~ ~ x y 2 N I ( E ) Q ( E , E ´´) Q ( E ´´, E ´) cos ( E ) cos ( E ´) e 2 ~ 2 x , y 0 k i 1 s 2 s I ln 1 ln 1 d E dE ´ ~ i 8 ( E ´´) ( E ´´) cos ( E ´) ( E ´´) cos ( E ) ( E ´) G 2 k 1 s s s s 1 s s 2 0 0 Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
W f . . . h n RRS L3 L2 h n < W K L1 K h n RRS = h n – Ω L2 L2 – Ω f – k Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
2 W 2 3 Kramers- Heisenberg ´s Equations 1 n M E E ( u ) d k 2 d ( E , E ) E e fi 0 s L k k 0 S S c (Time Depending Perturbation Theory) 2 3 dE E mc 8 S 0 P p u S k p u S 2 1 M W fi m ( E u i ) 0 k k K d ( E , E ) E 0 S S G ( E , E ) d ( E , E ) W W 0 S 2 2 dE 0 S E S K L S K E S W 2 E L e ( E E ) 0 f E 1 2 2 ( E , E ) e dE 0 1 W W ( E 0 E , ) 2 E 1 0 K L E 1 Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
Detector Detector Secondary Target (Z!!) X-Ray Tube Monochromator 45º 45º 45º 45º Sample Primary Target SR Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
XRF Beamline (LNLS) • Storage ring operating at 3.7 GeV and nominal current of 100 mA. • Silicon (111) channel -cut double-crystal monochromator.The energy resolution is 3×10 − 4 between 7 and 10 keV. • A motorized computer -controlled set of vertical and horizontal slits to limit the beam size, before and after the monochromator. • A ionization chamber to measure the primary beam intensity. • A Si(Li) solid state detector, with a resolution of 165 eV at 5.9 keV. • The samples were mounted in a vacuum chamber with a sample holder at 10 − 2 T orr in a standard geometrical configuration of 45 ◦ of incident and take-off angles. First Storage Ring Slits Second Sample Slits Holder Synchrotron Radiation Incident Beam Monochromator Solid State Detector X-Ray Eye Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
LNLS, D09B Beamline Channel Cut 1200 monochromator. Si(Li) Detector 1000 800 Intensity (a.u.) 600 400 200 0 7000 7500 8000 8500 9000 9500 10000 Energy [eV] KL-RRS spectrum of Zn obtained with incident energy of 9594 eV. Solid lines represent the data fitting of each peak. Sánchez, H.J. et al. J Phys B: At Mol Opt Pys 2006; 39: 1-11 h Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
F I I ( E )( 1 1 / R ) G 0 R 0 F ( E ) 2 ( E ) ( E ) d 0 F 0 K R I I G 2 1 e 0 F S G F ( E ) ( E ) 0 F 1,0 1,0 1,0 Measured KL-RRS cross section for 0,8 0,8 0,8 Measured KL-RRS cross section for Measured KL-RRS cross section for 2 /g] 2 /g] Cu (points) and a non-linear fitting 2 /g] RRS cross section [cm RRS cross section [cm RRS cross section [cm Zn (points) and a non-linear fitting Fe (points) and a non-linear fitting to an expression with the 0,6 0,6 0,6 to an expression with the to an expression with the functional form of the theoretical functional form of the theoretical functional form of the theoretical cross section (solid line) 0,4 0,4 0,4 cross section (solid line) cross section (solid line) d ( E , E ) E 0 S S G ( E , E ) 0,2 0,2 0,2 W W 0 S 2 2 dE E S K L S K A 0,0 0,0 0,0 y 6200 6300 6400 6500 6600 6700 6800 6900 7000 7100 8100 8200 8300 8400 8500 8600 8700 8800 8900 9000 8700 8800 8900 9000 9100 9200 9300 9400 9500 9600 9700 ( B x ) Energy [eV] Energy [eV] Energy [eV] MC Valentinuzzi et al. , X-Ray Spectrometry 37 , 555-560 (2008). Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
J. Sherman, Spectrochim. Acta 7 , 283 (1955). T. Shiraiwa and N. Fujino, Jpn. J . Appl. Phys. 5 , 886 (1966). f 1 c 1 , i 1 f 2 c 2 , i 2 I I I I ip s ip s I , c i I ' E ( ) s 2 Sample Reflector E max E 2 max ( E E ´) ~ ~ x 2 I ( E ) Q ( E , E ´) e 2 ~ 1 x 0 i I d E dE ´ ~ i 4 ( E ) ( E ´) G 2 s s 0 0 E max E max 2 ( E E ´) ~ ~ ~ x y 2 N I ( E ) Q ( E , E ´´) Q ( E ´´, E ´) cos ( E ) cos ( E ´) e 2 ~ 2 x , y 0 k i 1 s 2 s I ln 1 ln 1 d E dE ´ ~ i 8 ( E ´´) ( E ´´) cos ( E ´) ( E ´´) cos ( E ) ( E ´) G 2 k 1 s s s s 1 s s 2 0 0 Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
Analysis of impurities in silicon wafers by TXRF. The combination of VPD method and SR allows DL of 10 7 at/cm 2 . For Al impurities, Raman peak has to be considered! -7 2,0x10 Fluorescent Cu-K 1E-7 Zn-K Bkg Total 1E-6 Coherent Measured Spectrum Bkg Raman Mn-K Incoherent Ni-K Al K Line Bkg Incoh Raman 1E-7 Fe-K Total Bkg -7 Bkg Coh 1,5x10 Calculated spectrum of Raman Bkg Intensity [a.u.] 1E-8 Calculated spectrum of Intensity [a.u.] Si (0.9995) with Al Intensity [u.a.] 1E-8 a metal alloy irradiated 1E-9 impurities (0.0005) -7 1,0x10 with an Mo x-ray tube irradiated with 1E-10 @45 kV monochromatic photons 1E-11 1E-9 -8 of 1739 eV 5,0x10 1E-12 1E-13 3 4 5 6 7 8 9 10 11 1,0 1,2 1,4 1,6 1,8 2,0 2,2 0,0 Energy [keV] Energy [keV] 1,0 1,2 1,4 1,6 1,8 2,0 Energy [keV] Héctor Jorge Sánchez Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring - 17 November - 28 November 2014
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