I&T Data Products & Focal Plane Behavior Aaron Roodman - PowerPoint PPT Presentation

I&T Data Products & Focal Plane Behavior Aaron Roodman Project & Community Workshop 2018

I&T Data Products All needed to verify Camera meets Bad Pixel Map requirements Gain (Fe55 & PTC) Noise Dark Current Maps: by pixel, Linearity & Full Well supply as FITS files Diffusion with same structure Response Map (ie. QE) as images Deferred Charge (EPER, Fe55, Spots) Use EPER & Spots to characterize vs. Flux Brighter-Fatter Correlation Matrix Data by Amplifier: By Amplifier, from Flat Fields supply using Cross-talk Matrix standard identifiers: Focal-plane Height Map R I,J ; S I,J ; iAmp As-built Optical Model Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

Focal Plane Characterization Deferred Charge: RTM-005 Deferred Charge Stacked Xray hits: 2 Amps in RTM-005 show long-time constant deferred charge Bias Shifts A Snyder ● Large deferred charge signal seen in Amp 5 and Amp 11. ● Deferred charge signal scales as a function of flux, up to some flux value. Bias image with Bright Defect: Bias shifts in pixels read-out after saturated pixels Defect Y. Utsumi row number Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

Focal Plane Characterization Results: RTM-005 crosstalk Cross-Talk A Snyder No observed sensor to sensor Xtalk: measurements consistent with noise or due to artifacts Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

Focal Plane Characterization Noise Correlations P O’Connor Correlation Coefficients: Noise Correlations: Pixel-by-Pixel in Pixel value Amp #i vs. overscan region Mean(other 15 Amps) S02 & S21 have read noise >9 e- Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

I&T Camera Data Analysis Opportunities Focal Plane Electro-Optical Testing will occur with 1) 2 ETUs starting Nov 2018 (3 weeks) 2) 9 RTMs (+CRM) starting Feb 2019 (7 weeks) 3) All Rafts starting June 2019 (7 weeks) Total Focal Plane testing time is limited, and quick turn-around on analysis of test data is going to be essential. Default test analysis will be run, but there is much to study beyond that. Camera Test Rapid Response Team to follow-up problems, issues & anomalies Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop